LMM-IR: Large-Scale Netlist-Aware Multimodal Framework for Static IR-Drop Prediction

Static IR drop analysis is a fundamental and critical task in the field of chip design. Nevertheless, this process can be quite time-consuming, potentially requiring several hours. Moreover, addressing IR drop violations frequently demands iterative analysis, thereby causing the computational burden...

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Bibliographic Details

Published in:	2025 62nd ACM/IEEE Design Automation Conference (DAC) pp. 1 - 7
Main Authors:	Ma, Kai, Wang, Zhen, He, Hongquan, Xu, Qi, Chen, Tinghuan, Geng, Hao
Format:	Conference Proceeding
Language:	English
Published:	IEEE 22.06.2025
Subjects:	Chip scale packaging Point cloud compression Prediction algorithms Predictive models SPICE Technological innovation Three-dimensional displays Topology Transformers Voltage
Online Access:	Get full text
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