Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection

Recently, machine learning-based techniques have been applied for layout hotspot detection. However, existing methods encounter challenges in capturing the decision boundary across the entire dataset and ignore the geometric properties and topology of the polygons. In this paper, we introduce CLI-HD...

Full description

Bibliographic Details

Published in:	2025 62nd ACM/IEEE Design Automation Conference (DAC) pp. 1 - 6
Main Authors:	Chen, Silin, Di, Kangjian, Wang, Guohao, Zhao, Wenzheng, Du, Li, Zou, Ningmu
Format:	Conference Proceeding
Language:	English
Published:	IEEE 22.06.2025
Subjects:	Accuracy Contrastive learning Distance measurement Layout Shape Topology Training Transformers Vectors
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!