Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection

Recently, machine learning-based techniques have been applied for layout hotspot detection. However, existing methods encounter challenges in capturing the decision boundary across the entire dataset and ignore the geometric properties and topology of the polygons. In this paper, we introduce CLI-HD...

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Vydané v:	2025 62nd ACM/IEEE Design Automation Conference (DAC) s. 1 - 6
Hlavní autori:	Chen, Silin, Di, Kangjian, Wang, Guohao, Zhao, Wenzheng, Du, Li, Zou, Ningmu
Médium:	Konferenčný príspevok..
Jazyk:	English
Vydavateľské údaje:	IEEE 22.06.2025
Predmet:	Accuracy Contrastive learning Distance measurement Layout Shape Topology Training Transformers Vectors
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