Chen, S., Di, K., Wang, G., Zhao, W., Du, L., & Zou, N. (2025, June 22). Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection. 2025 62nd ACM/IEEE Design Automation Conference (DAC), 1-6. https://doi.org/10.1109/DAC63849.2025.11133380
Citace podle Chicago (17th ed.)Chen, Silin, Kangjian Di, Guohao Wang, Wenzheng Zhao, Li Du, a Ningmu Zou. "Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection." 2025 62nd ACM/IEEE Design Automation Conference (DAC) 22 Jun. 2025: 1-6. https://doi.org/10.1109/DAC63849.2025.11133380.
Citace podle MLA (9th ed.)Chen, Silin, et al. "Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection." 2025 62nd ACM/IEEE Design Automation Conference (DAC), 22 Jun. 2025, pp. 1-6, https://doi.org/10.1109/DAC63849.2025.11133380.