Flip-N-Write a simple deterministic technique to improve PRAM write performance, energy and endurance
The phase-change random access memory (PRAM) technology is fast maturing to production levels. Main advantages of PRAM are non-volatility, byte addressability, in-place programmability, low-power operation, and higher write endurance than that of current flash memories. However, the relatively low w...
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| Published in: | 2009 42nd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) pp. 347 - 357 |
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| Main Authors: | , |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
New York, NY, USA
ACM
12.12.2009
IEEE |
| Series: | ACM Conferences |
| Subjects: | |
| ISBN: | 9781605587981, 1605587982 |
| ISSN: | 1072-4451 |
| Online Access: | Get full text |
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