Joint design-time and post-silicon optimization for digitally tuned analog circuits

Joint design time and post-silicon optimization for analog circuits has been an open problem in literature because of the complex nature of analog circuit modeling and optimization. In this paper we formulate the co-optimization problem for digitally tuned analog circuits to optimize the parametric...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers s. 725 - 730
Hlavní autoři: Wei Yao, Yiyu Shi, Lei He, Pamarti, S.
Médium: Konferenční příspěvek
Jazyk:angličtina
Vydáno: IEEE 01.11.2009
Témata:
Analog circuits
Capacitance
Circuit optimization
Constraint optimization
Design optimization
Optimization methods
Phase locked loops
Space exploration
Transmitters
Tunable circuits and devices
ISSN:1092-3152
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:Joint design time and post-silicon optimization for analog circuits has been an open problem in literature because of the complex nature of analog circuit modeling and optimization. In this paper we formulate the co-optimization problem for digitally tuned analog circuits to optimize the parametric yield, subject to power and area constraints. A general optimization framework combing the branch-and-bound algorithm and gradient ascent method is proposed. We demonstrate our framework with two examples in high-speed serial link, the transmitter design and the phase-locked-loop (PLL) design. Simulation results show that compared with the design heuristic from analog designers' perspective, joint design-time and post-silicon optimization can improve the yield by up to 47% for transmitter design and up to 56% for PLL design under the same area and power constraints. To the best of the authors' knowledge, this is the first in-depth study on yield-driven analog circuit design technique that optimizes post-silicon tuning together with the design-time optimization.
ISSN:1092-3152
DOI:10.1145/1687399.1687534