Výsledky vyhledávání - Mathematics of computing Probability and statistics Statistical paradigms Statistical graphics

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    Multidimensional analog test metrics estimation using extreme value theory and statistical blockade Autor Stratigopoulos, Haralampos-G., Faubet, Pierre, Courant, Yoann, Mohamed, Firas

    ISBN: 1450320716, 9781450320719
    ISSN: 0738-100X
    Vydáno: New York, NY, USA ACM 29.05.2013
    “…The high cost of testing certain analog, mixed-signal, and RF circuits has driven in the recent years the development of alternative low-cost tests to replace…”
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    Bayesian methods for data analysis in software engineering Autor Sridharan, Mohan, Namin, Akbar Siami

    ISBN: 9781605587196, 1605587192
    ISSN: 0270-5257
    Vydáno: New York, NY, USA ACM 01.05.2010
    “…Software engineering researchers analyze programs by applying a range of test cases, measuring relevant statistics and reasoning about the observed phenomena…”
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  3. 3

    Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction Autor Li, Peng, Liu, Frank, Li, Xin, Pileggi, Lawrence T., Nassif, Sani R.

    ISBN: 9780769522883, 0769522882
    ISSN: 1530-1591
    Vydáno: Washington, DC, USA IEEE Computer Society 07.03.2005
    Vydáno v Design, Automation and Test in Europe (07.03.2005)
    “…Assessing IC manufacturing process fluctuations and their impacts on IC interconnect performance has become unavoidable for modern DSM designs. However, the…”
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    Defect Aware Test Patterns Autor Tang, Huaxing, Chen, Gang, Reddy, Sudhakar M., Wang, Chen, Rajski, Janusz, Pomeranz, Irith

    ISBN: 9780769522883, 0769522882
    ISSN: 1530-1591
    Vydáno: Washington, DC, USA IEEE Computer Society 07.03.2005
    Vydáno v Design, Automation and Test in Europe (07.03.2005)
    “…A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled…”
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  6. 6

    Buffer Insertion Considering Process Variation Autor Xiong, Jinjun, Tam, Kingho, He, Lei

    ISBN: 9780769522883, 0769522882
    ISSN: 1530-1591
    Vydáno: Washington, DC, USA IEEE Computer Society 07.03.2005
    Vydáno v Design, Automation and Test in Europe (07.03.2005)
    “…". We develop an efficient bottom-up recursive algorithm to calculate the joint probability density function that accurately captures the above correlation, and propose effective pruning rules…”
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  7. 7

    Simultaneous localization, calibration, and tracking in an ad hoc sensor network Autor Taylor, Christopher, Rahimi, Ali, Bachrach, Jonathan, Shrobe, Howard, Grue, Anthony

    ISBN: 9781595933348, 1595933344
    Vydáno: New York, NY, USA ACM 01.01.2006
    “…We introduce Simultaneous Localization and Tracking, called SLAT, the problem of tracking a target in a sensor network while simultaneously localizing and…”
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    Mapping ECG Signals on Variant Maps Autor Hou, Zhihui, Zheng, Jeffery

    ISBN: 1450349935, 9781450349932
    ISSN: 2473-991X
    Vydáno: New York, NY, USA ACM 31.07.2017
    “…This paper presents a mapping scheme of statistical distribution for ECG signals…”
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    A Statistical and Evolutionary Approach to Sentiment Analysis Autor Carvalho, Jonnathan, Prado, Adriana, Plastino, Alexandre

    Vydáno: IEEE 01.08.2014
    “… For this purpose, statistical methods have been inspired by the observation that if two words frequently appear together within the same context, they are likely to have the same polarity…”
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    Statistical Timing Analysis Using Bounds Autor Agarwal, Aseem, Blaauw, David, Zolotov, Vladimir, Vrudhula, Sarma

    ISBN: 0769518702, 9780769518701
    ISSN: 1530-1591
    Vydáno: Washington, DC, USA IEEE Computer Society 03.03.2003
    “… Since this method for finding the exact statistical delay has exponential run time complexity with circuit size, we also propose a new method for computing…”
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    Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step Autor Krstic, Angela, Wang, Li-C., Cheng, Kwang-Ting, Liou, Jing-Jia, Abadir, Magdy S.

    ISBN: 0769518702, 9780769518701
    ISSN: 1530-1591
    Vydáno: Washington, DC, USA IEEE Computer Society 03.03.2003
    “…This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models…”
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    Is Statistical Timing Statistically Significant? Autor Kahng, A.B., Goldman, R., Keutzer, K., Bittlestone, C., Bootehsaz, A., Borkar, S.Y., Chen, E., Scheffer, L., Visweswariah, C.

    ISBN: 1581138288, 9781581138283, 1511838288
    ISSN: 0738-100X
    Vydáno: New York, NY, USA ACM 07.06.2004
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    Statistical Techniques for Software Engineering Practice Autor Card, David N.

    ISBN: 9780769521633, 0769521630
    ISSN: 0270-5257
    Vydáno: Washington, DC, USA IEEE Computer Society 23.05.2004
    “…Many factors are combining to promote theuse of quantitative and statistical methods bypracticing software engineers…”
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    Nonparametric belief propagation for self-calibration in sensor networks Autor Ihler, Alexander T., Fisher, John W., Moses, Randolph L., Willsky, Alan S.

    ISBN: 1581138466, 9781581138467
    Vydáno: New York, NY, USA ACM 26.04.2004
    “… We demonstrate that the information used for sensor calibration is fundamentally local with regard to the network topology and use this observation to reformulate the problem within a graphical model framework…”
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    On soft error rate analysis of scaled CMOS designs - A statistical perspective Autor Huan-Kai Peng, Wen, C.H.-P., Bhadra, J.

    ISSN: 1092-3152
    Vydáno: IEEE 01.11.2009
    “… Considering the impact of process variation, a number of statistical natures of transient faults are found more sophisticated than their static ones…”
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    Statistical modeling with the virtual source MOSFET model Autor Yu, Li, Wei, Lan, Antoniadis, Dimitri, Elfadel, Ibrahim, Boning, Duane

    ISBN: 9781450321532, 1450321534
    Vydáno: San Jose, CA, USA EDA Consortium 18.03.2013
    “…A statistical extension of the ultra-compact Virtual Source (VS) MOSFET model is developed here for the first time…”
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    Mining Eclipse Developer Contributions via Author-Topic Models Autor Linstead, Erik, Rigor, Paul, Bajracharya, Sushil, Lopes, Cristina, Baldi, Pierre

    ISBN: 076952950X, 9780769529509
    ISSN: 2160-1852
    Vydáno: Washington, DC, USA IEEE Computer Society 20.05.2007
    “…We present the results of applying statistical author-topic models to a subset of the Eclipse…”
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    Towards a Theoretical Model for Software Growth Autor Herraiz, Israel, Gonzalez-Barahona, Jesus M., Robles, Gregorio

    ISBN: 076952950X, 9780769529509
    ISSN: 2160-1852
    Vydáno: Washington, DC, USA IEEE Computer Society 20.05.2007
    “… them. For this sample, we have found double Pareto statistical distributions for all metrics considered…”
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    Parametric Analysis of Real-Time Embedded Systems with Abstract Approximation Interpretation Autor Kang, Eun Young

    ISBN: 9780769521633, 0769521630
    ISSN: 0270-5257
    Vydáno: Washington, DC, USA IEEE Computer Society 23.05.2004
    “…My research area is fundamental of formal analysis ofreal-time embedded systems. The main objective of thisresearch is the theoretical and practical…”
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    Resampling methods of analysis in simulation studies Autor Cheng, Russell, Currie, Christine

    ISBN: 9781424457717, 1424457718
    Vydáno: Winter Simulation Conference 13.12.2009
    Vydáno v Winter Simulation Conference (13.12.2009)
    “…This is an introductory tutorial on the statistical analysis of simulation output, but focusing on the (elementary…”
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