Výsledky vyhledávání - Mathematics of computing Probability and statistics Statistical paradigms Statistical graphics
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Multidimensional analog test metrics estimation using extreme value theory and statistical blockade
ISBN: 1450320716, 9781450320719ISSN: 0738-100XVydáno: New York, NY, USA ACM 29.05.2013Vydáno v 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC) (29.05.2013)“…The high cost of testing certain analog, mixed-signal, and RF circuits has driven in the recent years the development of alternative low-cost tests to replace…”
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2
Bayesian methods for data analysis in software engineering
ISBN: 9781605587196, 1605587192ISSN: 0270-5257Vydáno: New York, NY, USA ACM 01.05.2010Vydáno v 2010 ACM/IEEE 32nd International Conference on Software Engineering (01.05.2010)“…Software engineering researchers analyze programs by applying a range of test cases, measuring relevant statistics and reasoning about the observed phenomena…”
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3
Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction
ISBN: 9780769522883, 0769522882ISSN: 1530-1591Vydáno: Washington, DC, USA IEEE Computer Society 07.03.2005Vydáno v Design, Automation and Test in Europe (07.03.2005)“…Assessing IC manufacturing process fluctuations and their impacts on IC interconnect performance has become unavoidable for modern DSM designs. However, the…”
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4
Circadian Rhythms in Neurospora Exhibit Biologically Relevant Driven and Damped Harmonic Oscillations
Vydáno: United States 01.08.2017Vydáno v ACM-BCB ... ... : the ... ACM Conference on Bioinformatics, Computational Biology and Biomedicine. ACM Conference on Bioinformatics, Computational Biology and Biomedicine (01.08.2017)“…Circadian rhythms are endogenous cycles of approximately 24 hours reinforced by external cues such as light. These cycles are typically modeled as harmonic…”
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Journal Article -
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Defect Aware Test Patterns
ISBN: 9780769522883, 0769522882ISSN: 1530-1591Vydáno: Washington, DC, USA IEEE Computer Society 07.03.2005Vydáno v Design, Automation and Test in Europe (07.03.2005)“…A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled…”
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Buffer Insertion Considering Process Variation
ISBN: 9780769522883, 0769522882ISSN: 1530-1591Vydáno: Washington, DC, USA IEEE Computer Society 07.03.2005Vydáno v Design, Automation and Test in Europe (07.03.2005)“…". We develop an efficient bottom-up recursive algorithm to calculate the joint probability density function that accurately captures the above correlation, and propose effective pruning rules…”
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Simultaneous localization, calibration, and tracking in an ad hoc sensor network
ISBN: 9781595933348, 1595933344Vydáno: New York, NY, USA ACM 01.01.2006Vydáno v IPSN 2006 : the Fifth International Conference on Information Processing in Sensor Networks : April 19-21, 2006, Nashville, Tennessee, USA (01.01.2006)“…We introduce Simultaneous Localization and Tracking, called SLAT, the problem of tracking a target in a sensor network while simultaneously localizing and…”
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Mapping ECG Signals on Variant Maps
ISBN: 1450349935, 9781450349932ISSN: 2473-991XVydáno: New York, NY, USA ACM 31.07.2017Vydáno v 2017 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining (ASONAM) (31.07.2017)“…This paper presents a mapping scheme of statistical distribution for ECG signals…”
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A Statistical and Evolutionary Approach to Sentiment Analysis
Vydáno: IEEE 01.08.2014Vydáno v 2014 IEEE/WIC/ACM International Joint Conferences on Web Intelligence (WI) and Intelligent Agent Technologies (IAT) (01.08.2014)“… For this purpose, statistical methods have been inspired by the observation that if two words frequently appear together within the same context, they are likely to have the same polarity…”
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10
Statistical Timing Analysis Using Bounds
ISBN: 0769518702, 9780769518701ISSN: 1530-1591Vydáno: Washington, DC, USA IEEE Computer Society 03.03.2003Vydáno v Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 (03.03.2003)“… Since this method for finding the exact statistical delay has exponential run time complexity with circuit size, we also propose a new method for computing…”
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Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step
ISBN: 0769518702, 9780769518701ISSN: 1530-1591Vydáno: Washington, DC, USA IEEE Computer Society 03.03.2003Vydáno v Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 (03.03.2003)“…This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models…”
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Is Statistical Timing Statistically Significant?
ISBN: 1581138288, 9781581138283, 1511838288ISSN: 0738-100XVydáno: New York, NY, USA ACM 07.06.2004Vydáno v Proceedings - ACM IEEE Design Automation Conference (07.06.2004)Získat plný text
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Statistical Techniques for Software Engineering Practice
ISBN: 9780769521633, 0769521630ISSN: 0270-5257Vydáno: Washington, DC, USA IEEE Computer Society 23.05.2004Vydáno v International Conference on Software Engineering: Proceedings of the 26th International Conference on Software Engineering; 23-28 May 2004 (23.05.2004)“…Many factors are combining to promote theuse of quantitative and statistical methods bypracticing software engineers…”
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Nonparametric belief propagation for self-calibration in sensor networks
ISBN: 1581138466, 9781581138467Vydáno: New York, NY, USA ACM 26.04.2004Vydáno v IPSN 2004 : Third International Symposium on Information Processing in Sensor Networks, April 26-27, 2004, Berkeley, California, USA (26.04.2004)“… We demonstrate that the information used for sensor calibration is fundamentally local with regard to the network topology and use this observation to reformulate the problem within a graphical model framework…”
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15
On soft error rate analysis of scaled CMOS designs - A statistical perspective
ISSN: 1092-3152Vydáno: IEEE 01.11.2009Vydáno v 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (01.11.2009)“… Considering the impact of process variation, a number of statistical natures of transient faults are found more sophisticated than their static ones…”
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Statistical modeling with the virtual source MOSFET model
ISBN: 9781450321532, 1450321534Vydáno: San Jose, CA, USA EDA Consortium 18.03.2013Vydáno v Proceedings of the Conference on Design, Automation and Test in Europe (18.03.2013)“…A statistical extension of the ultra-compact Virtual Source (VS) MOSFET model is developed here for the first time…”
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17
Mining Eclipse Developer Contributions via Author-Topic Models
ISBN: 076952950X, 9780769529509ISSN: 2160-1852Vydáno: Washington, DC, USA IEEE Computer Society 20.05.2007Vydáno v Proceedings of the Fourth International Workshop on Mining Software Repositories (20.05.2007)“…We present the results of applying statistical author-topic models to a subset of the Eclipse…”
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18
Towards a Theoretical Model for Software Growth
ISBN: 076952950X, 9780769529509ISSN: 2160-1852Vydáno: Washington, DC, USA IEEE Computer Society 20.05.2007Vydáno v Proceedings of the Fourth International Workshop on Mining Software Repositories (20.05.2007)“… them. For this sample, we have found double Pareto statistical distributions for all metrics considered…”
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Parametric Analysis of Real-Time Embedded Systems with Abstract Approximation Interpretation
ISBN: 9780769521633, 0769521630ISSN: 0270-5257Vydáno: Washington, DC, USA IEEE Computer Society 23.05.2004Vydáno v International Conference on Software Engineering: Proceedings of the 26th International Conference on Software Engineering; 23-28 May 2004 (23.05.2004)“…My research area is fundamental of formal analysis ofreal-time embedded systems. The main objective of thisresearch is the theoretical and practical…”
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Resampling methods of analysis in simulation studies
ISBN: 9781424457717, 1424457718Vydáno: Winter Simulation Conference 13.12.2009Vydáno v Winter Simulation Conference (13.12.2009)“…This is an introductory tutorial on the statistical analysis of simulation output, but focusing on the (elementary…”
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