Výsledky vyhledávání - Hardware Hardware validation Functional verification
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RFUZZ: Coverage-Directed Fuzz Testing of RTL on FPGAs
ISSN: 1558-2434Vydáno: ACM 01.11.2018Vydáno v 2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2018)“…Dynamic verification is widely used to increase confidence in the correctness of RTL circuits during the pre-silicon design phase…”
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An Efficient Algorithm for Sparse Quantum State Preparation
Vydáno: IEEE 05.12.2021Vydáno v 2021 58th ACM/IEEE Design Automation Conference (DAC) (05.12.2021)“…Generating quantum circuits that prepare specific states is an essential part of quantum compilation. Algorithms that solve this problem for general states…”
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EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…As functional safety of electronic chips gains importance in autonomous vehicles and aerospace, standards like ISO 26262 mandate high diagnostic coverage, requiring extensive gate-level fault simulations…”
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Bit-Slicing the Hilbert Space: Scaling Up Accurate Quantum Circuit Simulation
Vydáno: IEEE 05.12.2021Vydáno v 2021 58th ACM/IEEE Design Automation Conference (DAC) (05.12.2021)“… Quantum circuit simulation plays a key role in the toolchain of quantum hardware and software development…”
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EPIC: Error PredIction and Correction for Power-Efficient Voltage Underscaling Multiply-Accumulate Unit
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“… A prediction bits searching algorithm is proposed to enhance the prediction accuracy with low hardware cost, resulting in up to 100% accuracy…”
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Leveraging Critical Proof Obligations for Efficient IC3 Verification
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…IC3 and its variants are SAT-based model-checking methods that play a critical role in hardware verification…”
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Generative Model Based Standard Cell Timing Library Characterization
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…Accurate cell timing characterization is essential, on which static timing analysis relies to verify timing performance and ensure design robustness across…”
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Late Breaking Results: Test Selection For RTL Coverage By Unsupervised Learning From Fast Functional Simulation
Vydáno: IEEE 09.07.2023Vydáno v 2023 60th ACM/IEEE Design Automation Conference (DAC) (09.07.2023)“…Functional coverage closure is an important but RTL simulation intensive aspect of constrained random verification…”
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Swift or Exact? Boosting Efficient Microarchitecture DSE via Multi-fidelity Partial Order Prediction
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…A significant challenge in microarchitecture design space exploration (DSE) lies in the time-intensive synthesis and simulation process, making rapid design…”
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Late Breaking Results: Opera: An Open and Efficient Platform for Data-driven Synthesis of Analog Circuits
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…The front-end synthesis of analog circuits has been a long-standing challenge since the advent of integrated circuits. Many methods, ranging from conventional…”
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Revisiting and Improving Retrieval-Augmented Deep Assertion Generation
ISSN: 2643-1572Vydáno: IEEE 11.09.2023Vydáno v IEEE/ACM International Conference on Automated Software Engineering : [proceedings] (11.09.2023)“…Unit testing validates the correctness of the unit under test and has become an essential activity in software development process. A unit test consists of a…”
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SDM-PEB: Spatial-Depthwise Mamba for Enhanced Post-Exposure Bake Simulation
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…The post-exposure bake (PEB) process is a critical step in semiconductor lithography, directly impacting resist profile accuracy and circuit pattern fidelity…”
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A Cutting-Edge Parallel Solver for Scalable Power Grid Analysis Using Nested Domain Decomposition
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…As transistor scaling approaches sub-5 nm technologies, power distribution networks (PDNs) in integrated circuits have grown increasingly complex, with…”
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MemSens: Significantly Reducing Memory Overhead in Adjoint Sensitivity Analysis Using Novel Error-Bounded Lossy Compression
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…Adjoint sensitivity analysis is an exceptionally efficient method for computing the gradient of an objective function with respect to given parameters, playing a crucial role in modern circuit design and verification…”
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HPIM-NoC: A Priori-Knowledge-Based Optimization Framework for Heterogeneous PIM-Based NoCs
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…Network-on-Chip (NoC) accelerators with heterogeneous Processing-in-Memory (PIM) cores achieve superior performance than homogeneous ones for neural networks…”
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GSIM: Accelerating RTL Simulation for Large-Scale Designs
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…Register Transfer Level (RTL) simulation is widely used in design space exploration, verification, debugging, and preliminary performance evaluation for hardware design…”
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Bayesian Inference Based Robust Computing on Memristor Crossbar
Vydáno: IEEE 05.12.2021Vydáno v 2021 58th ACM/IEEE Design Automation Conference (DAC) (05.12.2021)“… In this paper, we propose a unified Bayesian inference based framework which connects hardware variations and algorithmic training together for robust computing on memristor crossbars…”
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SimPhony: A Device-Circuit-Architecture Cross-Layer Modeling and Simulation Framework for Heterogeneous Electronic-Photonic AI System
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“… The lack of a flexible, accurate, fast, and easy-to-use EPIC AI system simulation framework significantly limits the exploration of hardware innovations and system evaluations on common benchmark…”
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Accelerating design-technology co-development using neural compact modeling and data-driven SPICE simulation
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…This paper proposes a new design-technology cooptimization framework that expedites circuit optimization by utilizing the neural compact modeling (NCM) and a…”
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INSIGHT: A Universal Neural Simulator Framework for Analog Circuits with Autoregressive Transformers
Vydáno: IEEE 22.06.2025Vydáno v 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)“…The compute-intensive nature of SPICE simulations hinders effective analog design automation. This paper introduces INSIGHT, a data-efficient, adaptive,…”
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