Výsledky vyhledávání - Engineering::Computer science and engineering::Hardware::Performance and reliability*

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    Some Challenges and Opportunities in Reliability Engineering Autor Zio, Enrico

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.12.2016
    Vydáno v IEEE transactions on reliability (01.12.2016)
    “…Today's fast-pace evolving and digitalizing World is posing new challenges to reliability engineering…”
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    Reliability of a Distributed Computing System With Performance Sharing Autor Xiao, Hui, Yi, Kunxiang, Peng, Rui, Kou, Gang

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.12.2022
    Vydáno v IEEE transactions on reliability (01.12.2022)
    “…Existing research has been concentrated on improving the reliability of a distributed computing system through optimizing tasks allocation, providing software redundancy and providing hardware redundancy…”
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    Toward Industrial Metaverse: Age of Information, Latency and Reliability of Short-Packet Transmission in 6G Autor Cao, Jie, Zhu, Xu, Sun, Sumei, Wei, Zhongxiang, Jiang, Yufei, Wang, Jingjing, Lau, Vincent K.N.

    ISSN: 1536-1284, 1558-0687
    Vydáno: New York IEEE 01.04.2023
    Vydáno v IEEE wireless communications (01.04.2023)
    “… We are motivated to re-look at the coupled relationships of Key Performance Indicators (KPIs) - for example: AoI latency and reliability in sixth-generation…”
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    Analyzing and Increasing the Reliability of Convolutional Neural Networks on GPUs Autor Santos, Fernando Fernandes dos, Pimenta, Pedro Foletto, Lunardi, Caio, Draghetti, Lucas, Carro, Luigi, Kaeli, David, Rech, Paolo

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.06.2019
    Vydáno v IEEE transactions on reliability (01.06.2019)
    “…) for image detection. As GPU-enabled CNNs move into safety-critical environments, reliability is becoming a growing concern…”
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    Reliability Assessment of Multi-State Phased Mission Systems With Common Bus Performance Sharing Subjected to Epistemic Uncertainty Autor Cheng, Chen, Yang, Jun, Li, Lei

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.09.2022
    Vydáno v IEEE transactions on reliability (01.09.2022)
    “… Besides, the impact of transmission loss and performance storage on reliability needs to be considered in the modeling of performance sharing systems…”
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    Reverse Engineering of Algebraic Inequalities for System Reliability Predictions and Enhancing Processes in Engineering Autor Todinov, Michael

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.06.2024
    Vydáno v IEEE transactions on reliability (01.06.2024)
    “… In this article, we use reverse engineering of a novel algebraic inequality to demonstrate that the prevalent practice of using average reliability on demand for components of the same type…”
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    Accelerating DNN Inference With Reliability Guarantee in Vehicular Edge Computing Autor Liu, Kai, Liu, Chunhui, Yan, Guozhi, Lee, Victor C. S., Cao, Jiannong

    ISSN: 1063-6692, 1558-2566
    Vydáno: New York IEEE 01.12.2023
    Vydáno v IEEE/ACM transactions on networking (01.12.2023)
    “…This paper explores on accelerating Deep Neural Network (DNN) inference with reliability guarantee in Vehicular Edge Computing (VEC…”
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    An Overview of Adaptive-Surrogate-Model-Assisted Methods for Reliability-Based Design Optimization Autor Ling, Chunyan, Kuo, Way, Xie, Min

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.09.2023
    Vydáno v IEEE transactions on reliability (01.09.2023)
    “…Reliability-based design optimization (RBDO) is one of the most crucial techniques in complex and reliability-critical engineering systems…”
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    Load balancing in cloud computing environment using the Grey wolf optimization algorithm based on the reliability: performance evaluation Autor Sefati, SeyedSalar, Mousavinasab, Maryamsadat, Zareh Farkhady, Roya

    ISSN: 0920-8542, 1573-0484
    Vydáno: New York Springer US 01.01.2022
    Vydáno v The Journal of supercomputing (01.01.2022)
    “…The introduction of cloud computing has brought about significant developments in information technology. Users can benefit from the multitude of cloud…”
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    Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks Autor Mondal, Atiquzzaman, Singh, Keshav, Biswas, Sudip

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.09.2025
    Vydáno v IEEE transactions on reliability (01.09.2025)
    “…This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS…”
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    Age of Information, Latency, and Reliability in Intelligent Vehicular Networks Autor Guo, Chongtao, Wang, Xijun, Liang, Le, Li, Geoffrey Ye

    ISSN: 0890-8044, 1558-156X
    Vydáno: New York IEEE 01.11.2023
    Vydáno v IEEE network (01.11.2023)
    “… Afterwards, we uncover the relationship among AoI, latency, and reliability, and propose a novel graphical packet delivery model that is powerful for analyzing AoI performance…”
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    High-Throughput and Energy-Efficient VLSI Architecture for Ordered Reliability Bits GRAND Autor Abbas, Syed Mohsin, Tonnellier, Thibaud, Ercan, Furkan, Jalaleddine, Marwan, Gross, Warren J.

    ISSN: 1063-8210, 1557-9999
    Vydáno: New York IEEE 01.06.2022
    “…Ultrareliable low-latency communication (URLLC), a major 5G new-radio (NR) use case, is the key enabler for applications with strict reliability and latency requirements…”
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    Enhancing Neural Network Reliability: Insights From Hardware/Software Collaboration With Neuron Vulnerability Quantization Autor Wang, Jing, Zhu, Jinbin, Fu, Xin, Zang, Di, Li, Keyao, Zhang, Weigong

    ISSN: 0018-9340, 1557-9956
    Vydáno: New York IEEE 01.08.2024
    Vydáno v IEEE transactions on computers (01.08.2024)
    “… We thereby develop a hardware/software collaborative method that guarantees the reliability of DNNs while minimizing performance degradation…”
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    Reliability Evaluation of an Imprecise Multistate System With Mixed Uncertainty Autor Yang, Lechang, Wang, Chenxing, Ling, Chunyan, Xie, Min

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.03.2024
    Vydáno v IEEE transactions on reliability (01.03.2024)
    “…Reliability evaluation of complex systems like bridge systems or network model is of great interest but challenging as such reliability models cannot be recursively decomposed into combinations…”
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    Optimizing Power Resilience Performance of Intelligent Solar Photovoltaic System for Smart Energy Management Considering Reliability and Cost Autor Dui, Hongyan, Lu, Yaohui, Xing, Liudong

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.09.2025
    Vydáno v IEEE transactions on reliability (01.09.2025)
    “… Different from existing studies that improve the PV efficiency by changing cell materials, this article proposes a novel system reliability and cost model of enhancing the PV power resilience…”
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    Decision Support System for Optimal Selection of Software Reliability Growth Models Using a Hybrid Approach Autor Garg, Rakesh, Raheja, Supriya, Garg, Ramesh Kumar

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.03.2022
    Vydáno v IEEE transactions on reliability (01.03.2022)
    “…A hybrid approach, namely "entropy-combinative distance-Based assessment (CODAS-E)," is proposed and presented to select and rank software reliability growth…”
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    q-Weibull Distributions: Perspectives and Applications in Reliability Engineering Autor Xu, Meng, Mao, Huachao

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.09.2025
    Vydáno v IEEE transactions on reliability (01.09.2025)
    “…Lifetime distributions, such as Weibull and log-logistic distributions, are critical for parametric and semi-parametric analysis in reliability engineering…”
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    Bayesian Reliability Assessment of Permanent Magnet Brake Under Small Sample Size Autor Xu, Ancha, Wang, Binbing, Zhu, Di, Pang, Jihong, Lian, Xinze

    ISSN: 0018-9529, 1558-1721
    Vydáno: New York IEEE 01.03.2025
    Vydáno v IEEE transactions on reliability (01.03.2025)
    “… However, evaluating the reliability of PMBs is challenging due to their complex construction and limited data availability…”
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