Výsledky vyhledávání - "ellipsometry"

Advanced Mueller matrix ellipsometry: Instrumentation and emerging applications Autor Chen, XiuGuo, Gu, HongGang, Liu, JiaMin, Chen, Chao, Liu, ShiYuan

“…Mueller matrix ellipsometry (MME) provides the 4×4 Mueller matrix of a sample under test, which determines how the state of polarization is changed as light…”
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Handbook of Ellipsometry Autor Tompkins, Harland G., Irene, Eugene A

“…The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and…”
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A versatile method for exploring the magnetooptical properties of polar saturated and unsaturated ferromagnetic metallic thin films Autor Patra, Rajkumar, Sharma, Apoorva, Stöcker, Hartmut, Monecke, Manuel, Salvan, Georgeta, Mattheis, Roland, Schmidt, Heidemarie

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Imaging Mueller matrix ellipsometry measurements on measuring fields in the micrometre range Autor Grundmann, Jana, Bodermann, Bernd

“…An imaging Mueller matrix ellipsometer is used to measure structures in measuring fields in the micrometre range, which are too small for conventional…”
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3D- printed modular spr platform integrated with ellipsometer for in-situ label-free optical sensing applications Autor Mandal, Natasha, Mayanglambam, Sushilata D., Moirangthem, Rakesh S.

“…•Development of user-friendly, durable, light-weight, and cost-effective 3D-printed SPR module integrated with commercial Ellipsometer.•Label-free, highly…”
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Ellipsometry of ultrathin transparent films. Some aspects of optimum experimental conditions choice Autor Kostruba, A., Stetsyshyn, Yu, Savaryn, V., Koda, E., Stybel, V., Mayevska, S., Kernytskyy, I.

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Ensemble Learning-Fused Solution to the Inverse Problem in Integrated Optical Critical Dimension Metrology Autor Guo, Chunfu, Liu, Jiamin, Gu, Honggang, Zhu, Jinlong, Zhang, Chuanwei, Chen, Xiuguo, Jiang, Hao, Liu, Shiyuan

“…In sub-28-nm nodes, existing optical critical dimension (OCD) metrology tools are challenging to simultaneously and thoroughly meet the metrology requirements…”
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Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures Autor Käseberg, Tim, Grundmann, Jana, Siefke, Thomas, Klapetek, Petr, Valtr, Miroslav, Kroker, Stefanie, Bodermann, Bernd

“…Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures…”
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Modelling of immunosensor response: the evaluation of binding kinetics between an immobilized receptor and structurally-different genetically engineered ligands Autor Balevicius, Zigmas, Talbot, Julian, Tamosaitis, Linas, Plikusiene, Ieva, Stirke, Arunas, Mickiene, Gitana, Balevicius, Saulius, Paulauskas, Andrius, Ramanavicius, Arunas

“…[Display omitted] •Binding kinetics between immobilized receptor and several genetically engineered ligands (GELs) was evaluated.•GELs were differing by…”
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Chiral Excitonic Organic Photodiodes for Direct Detection of Circular Polarized Light Autor Schulz, Matthias, Balzer, Frank, Scheunemann, Dorothea, Arteaga, Oriol, Lützen, Arne, Meskers, Stefan C. J., Schiek, Manuela

“…A facile route to soft matter self‐powered bulk heterojunction photodiode detectors sensitive to the circular polarization state of light is shown based on the…”
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Sixty years of electrochemical optical spectroscopy: a retrospective Autor Li, Chao-Yu, Tian, Zhong-Qun

“…Sixty years ago, Reddy, Devanatan, and Bockris performed the first electrochemical ellipsometry experiment, which ushered in a new era in the study of…”
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Optical characterization of Sm3+ doped phosphate glasses for potential orange laser applications Autor Bayoudhi, Dorsaf, Bouzidi, Chaker, Matei, Elena, Secu, Mihail, Catalin Galca, Aurelian

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In situ ellipsometry studies on swelling of thin polymer films: A review Autor Ogieglo, Wojciech, Wormeester, Herbert, Eichhorn, Klaus-Jochen, Wessling, Matthias, Benes, Nieck E.

“…The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological…”
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Handbook of ellipsometry Autor Tompkins, Harland, Irene, Eugene A

“…The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and…”
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Investigation of the optical properties of Pb1-xCdxTe films using spectroscopic ellipsometry Autor Kovach, Samuel, Maksimov, Oleg, Bhattacharya, Pijush, Peiris, Frank

“…•Single phase rock-salt Pb1-xCdxTe (0 ≤ x ≤ 0.15) films were produced.•The lattice constant of Pb1-xCdxTe decreases as a function of Cd concentration.•The band…”
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Complex refractive indices measurements of polymers in infrared bands Autor Zhang, Xiaoning, Qiu, Jun, Zhao, Junming, Li, Xingcan, Liu, Linhua

“…•The complex refractive indices of PDMS with different ratios of composition in infrared bands are measured.•The measured refractive indices of polymers in…”
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Stokes-vector and Mueller-matrix polarimetry [Invited] Autor Azzam, R M A

“…This paper reviews the current status of instruments for measuring the full 4×1 Stokes vector S, which describes the state of polarization (SOP) of totally or…”
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Measurement of the Optical Constants of Sand Samples Using Ellipsometry on Sand-Adhesive Composites Autor Frantz, Jesse A, Hart, Matthew B, McGinnis, Cobey L, Myers, Jason D, Ewing, Kenneth J, Selby, James B, Major, Kevin J, Watnik, Abbie T, Sanghera, Jasbinder S

“…In order to model the propagation of light through a sand cloud, it is critical to have accurate data for the optical constants of the sand particles that…”
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Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide Autor Jellison, Gerald E., Hermann, Raphaël P., Specht, Elliot D., Boatner, Lynn A., Zac Ward, T., Herklotz, Andreas

“…Several bulk and thin‐film crystals of SnO2 are grown and examined using generalized ellipsometry techniques. The bulk samples are grown using the chemical…”
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Development of a broadband Mueller matrix ellipsometer as a powerful tool for nanostructure metrology Autor Liu, Shiyuan, Chen, Xiuguo, Zhang, Chuanwei

“…Ellipsometric scatterometry has gained wide industrial applications in semiconductor manufacturing after ten years of development. Among the various types of…”
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