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    Prioritizing Test Inputs for Deep Neural Networks via Mutation Analysis by Wang, Zan, You, Hanmo, Chen, Junjie, Zhang, Yingyi, Dong, Xuyuan, Zhang, Wenbin

    ISBN: 1665402962, 9781665402965
    ISSN: 1558-1225
    Published: IEEE 01.05.2021
    “…Deep Neural Network (DNN) testing is one of the most widely-used ways to guarantee the quality of DNNs. However, labeling test inputs to check the correctness…”
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    Conference Proceeding