Výsledky vyhledávání - "Microscopy and microanalysis"

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Autor Ophus, Colin

“…Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent…”
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py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis Autor Savitzky, Benjamin H., Zeltmann, Steven E., Hughes, Lauren A., Brown, Hamish G., Zhao, Shiteng, Pelz, Philipp M., Pekin, Thomas C., Barnard, Edward S., Donohue, Jennifer, Rangel DaCosta, Luis, Kennedy, Ellis, Xie, Yujun, Janish, Matthew T., Schneider, Matthew M., Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Dhall, Rohan, Bustillo, Karen C., Ercius, Peter, Scott, Mary C., Ciston, Jim, Minor, Andrew M., Ophus, Colin

“…Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms…”
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High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy Autor Tate, Mark W., Purohit, Prafull, Chamberlain, Darol, Nguyen, Kayla X., Hovden, Robert, Chang, Celesta S., Deb, Pratiti, Turgut, Emrah, Heron, John T., Schlom, Darrell G., Ralph, Daniel C., Fuchs, Gregory D., Shanks, Katherine S., Philipp, Hugh T., Muller, David A., Gruner, Sol M.

“…We describe a hybrid pixel array detector (electron microscope pixel array detector, or EMPAD) adapted for use in electron microscope applications, especially…”
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High Throughput Quantitative Metallography for Complex Microstructures Using Deep Learning: A Case Study in Ultrahigh Carbon Steel Autor DeCost, Brian L., Lei, Bo, Francis, Toby, Holm, Elizabeth A.

“…We apply a deep convolutional neural network segmentation model to enable novel automated microstructure segmentation applications for complex microstructures…”
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Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching Autor Ophus, Colin, Zeltmann, Steven E., Bruefach, Alexandra, Rakowski, Alexander, Savitzky, Benjamin H., Minor, Andrew M., Scott, Mary C.

“…Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust…”
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A Review of Strain Analysis Using Electron Backscatter Diffraction Autor Wright, Stuart I., Nowell, Matthew M., Field, David P.

“…Since the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials…”
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A Versatile and Reproducible Cryo-sample Preparation Methodology for Atom Probe Studies Autor Woods, Eric V, Singh, Mahander P, Kim, Se-Ho, Schwarz, Tim M, Douglas, James O, El-Zoka, Ayman A, Giulani, Finn, Gault, Baptiste

“…Repeatable and reliable site-specific preparation of specimens for atom probe tomography (APT) at cryogenic temperatures has proven challenging. A generalized…”
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Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data Autor Groschner, Catherine K., Choi, Christina, Scott, Mary C.

“…In the field of transmission electron microscopy, data interpretation often lags behind acquisition methods, as image processing methods often have to be…”
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In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View Autor Schwarz, Tim M, Woods, Eric, Singh, Mahander P, Chen, Xinren, Jung, Chanwon, Aota, Leonardo S, Jang, Kyuseon, Krämer, Mathias, Kim, Se-Ho, McCarroll, Ingrid, Gault, Baptiste

“…Atom probe tomography requires needle-shaped specimens with a diameter typically below 100 nm, making them both very fragile and reactive, and defects (notches…”
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Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography Autor Gault, Baptiste, Saksena, Aparna, Sauvage, Xavier, Bagot, Paul, Aota, Leonardo S, Arlt, Jonas, Belkacemi, Lisa T, Boll, Torben, Chen, Yi-Sheng, Daly, Luke, Djukic, Milos B, Douglas, James O, Duarte, Maria J, Felfer, Peter J, Forbes, Richard G, Fu, Jing, Gardner, Hazel M, Gemma, Ryota, Gerstl, Stephan S A, Gong, Yilun, Hachet, Guillaume, Jakob, Severin, Jenkins, Benjamin M, Jones, Megan E, Khanchandani, Heena, Kontis, Paraskevas, Krämer, Mathias, Kühbach, Markus, Marceau, Ross K W, Mayweg, David, Moore, Katie L, Nallathambi, Varatharaja, Ott, Benedict C, Poplawsky, Jonathan D, Prosa, Ty, Pundt, Astrid, Saha, Mainak, Schwarz, Tim M, Shang, Yuanyuan, Shen, Xiao, Vrellou, Maria, Yu, Yuan, Zhao, Yujun, Zhao, Huan, Zou, Bowen

“…As hydrogen is touted as a key player in the decarbonization of modern society, it is critical to enable quantitative hydrogen (H) analysis at high spatial…”
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Developing and Evaluating Deep Neural Network-Based Denoising for Nanoparticle TEM Images with Ultra-Low Signal-to-Noise Autor Vincent, Joshua L., Manzorro, Ramon, Mohan, Sreyas, Tang, Binh, Sheth, Dev Y., Simoncelli, Eero P., Matteson, David S., Fernandez-Granda, Carlos, Crozier, Peter A.

“…A deep convolutional neural network has been developed to denoise atomic-resolution transmission electron microscope image datasets of nanoparticles acquired…”
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage Autor Nord, Magnus, Webster, Robert W. H., Paton, Kirsty A., McVitie, Stephen, McGrouther, Damien, MacLaren, Ian, Paterson, Gary W.

“…The use of fast pixelated detectors and direct electron detection technology is revolutionizing many aspects of scanning transmission electron microscopy…”
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Proliferation of Faulty Materials Data Analysis in the Literature Autor Linford, Matthew R., Smentkowski, Vincent S., Grant, John T., Brundle, C. Richard, Sherwood, Peter M.A., Biesinger, Mark C., Terry, Jeff, Artyushkova, Kateryna, Herrera-Gómez, Alberto, Tougaard, Sven, Skinner, William, Pireaux, Jean-Jacques, McConville, Christopher F., Easton, Christopher D., Gengenbach, Thomas R., Major, George H., Dietrich, Paul, Thissen, Andreas, Engelhard, Mark, Powell, Cedric J., Gaskell, Karen J., Baer, Donald R.

“…As a group of subject matter experts in X-ray photoelectron spectroscopy (XPS), we write this letter to raise awareness of the epidemic of poor and incorrect…”
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Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods Autor Gault, Baptiste, Klaes, Benjamin, Morgado, Felipe F., Freysoldt, Christoph, Li, Yue, De Geuser, Frederic, Stephenson, Leigh T., Vurpillot, François

“…Atom probe tomography (APT) is often introduced as providing “atomic-scale” mapping of the composition of materials and as such is often exploited to analyze…”
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Very-High Dynamic Range, 10,000 Frames/Second Pixel Array Detector for Electron Microscopy Autor Philipp, Hugh T., Tate, Mark W., Shanks, Katherine S., Mele, Luigi, Peemen, Maurice, Dona, Pleun, Hartong, Reinout, van Veen, Gerard, Shao, Yu-Tsun, Chen, Zhen, Thom-Levy, Julia, Muller, David A., Gruner, Sol M.

“…Precision and accuracy of quantitative scanning transmission electron microscopy (STEM) methods such as ptychography, and the mapping of electric, magnetic,…”
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The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy Autor Ercius, Peter, Johnson, Ian J, Pelz, Philipp, Savitzky, Benjamin H, Hughes, Lauren, Brown, Hamish G, Zeltmann, Steven E, Hsu, Shang-Lin, Pedroso, Cassio C S, Cohen, Bruce E, Ramesh, Ramamoorthy, Paul, David, Joseph, John M, Stezelberger, Thorsten, Czarnik, Cory, Lent, Matthew, Fong, Erin, Ciston, Jim, Scott, Mary C, Ophus, Colin, Minor, Andrew M, Denes, Peter

“…We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy…”
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A Mathematical Model for Determining Carbon Coating Thickness and Its Application in Electron Probe Microanalysis Autor Zhang, Ruo-Xi, Yang, Shui-Yuan

“…In electron probe microanalysis where materials are coated with a thin conductive carbon coat before analysis, the X-ray intensity detected from a specimen may…”
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Differences in Collagen Fiber Diameter and Waviness between Healthy and Aneurysmal Abdominal Aortas Autor Niestrawska, Justyna A., Pukaluk, Anna, Babu, Anju R., Holzapfel, Gerhard A.

“…Collagen plays a key role in the strength of aortic walls, so studying micro-structural changes during disease development is critical to better understand…”
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Human Umbilical Vein Endothelial Cells as a Versatile Cellular Model System in Diverse Experimental Paradigms: An Ultrastructural Perspective Autor Duranova, Hana, Kuzelova, Lenka, Borotova, Petra, Simora, Veronika, Fialkova, Veronika

“…Human umbilical vein endothelial cells (HUVECs) are primary cells isolated from the vein of an umbilical cord, extensively used in cardiovascular studies and…”
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Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography Autor Jenkins, Benjamin M., Danoix, Frédéric, Gouné, Mohamed, Bagot, Paul A.J., Peng, Zirong, Moody, Michael P., Gault, Baptiste

“…Interfaces play critical roles in materials and are usually both structurally and compositionally complex microstructural features. The precise…”
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