Search Results - "Hardware Hardware validation Functional verification"

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  1. 1

    RFUZZ: Coverage-Directed Fuzz Testing of RTL on FPGAs by Laeufer, Kevin, Koenig, Jack, Kim, Donggyu, Bachrach, Jonathan, Sen, Koushik

    ISSN: 1558-2434
    Published: ACM 01.11.2018
    “…Dynamic verification is widely used to increase confidence in the correctness of RTL circuits during the pre-silicon design phase. Despite numerous attempts…”
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    Conference Proceeding
  2. 2

    An Efficient Algorithm for Sparse Quantum State Preparation by Gleinig, Niels, Hoefler, Torsten

    Published: IEEE 05.12.2021
    “…Generating quantum circuits that prepare specific states is an essential part of quantum compilation. Algorithms that solve this problem for general states…”
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    Conference Proceeding
  3. 3

    Bit-Slicing the Hilbert Space: Scaling Up Accurate Quantum Circuit Simulation by Tsai, Yuan-Hung, Jiang, Jie-Hong R., Jhang, Chiao-Shan

    Published: IEEE 05.12.2021
    “…Recent advancements in quantum technologies shed light on viable quantum computation in near future. Quantum circuit simulation plays a key role in the…”
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    Conference Proceeding
  4. 4

    EPIC: Error PredIction and Correction for Power-Efficient Voltage Underscaling Multiply-Accumulate Unit by Wu, Tongjing, Hu, Xiaolu, Li, Tong, Liu, Siting, Wang, Hui, He, Weifeng, Mao, Zhigang, Jiang, Honglan

    Published: IEEE 22.06.2025
    “…Matrix multiplication dominates the power consumption in compute-intensive applications such as deep neural networks (DNNs), spurring intensive investigations…”
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    Conference Proceeding
  5. 5

    EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components by Wang, Mingjun, Wang, Hui, Mu, Jianan, Zhang, Xinyu, Sun, Bin, Wen, Yihan, Liu, Zizhen, Gu, Feng, Gao, Jun, Liang, Shengwen, Ye, Jing, Li, Xiaowei, Li, Huawei

    Published: IEEE 22.06.2025
    “…As functional safety of electronic chips gains importance in autonomous vehicles and aerospace, standards like ISO 26262 mandate high diagnostic coverage,…”
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    Conference Proceeding
  6. 6

    A Cutting-Edge Parallel Solver for Scalable Power Grid Analysis Using Nested Domain Decomposition by Song, Jianfei, Yang, Xiaoyu, Jin, Zhou, Zhuo, Cheng

    Published: IEEE 22.06.2025
    “…As transistor scaling approaches sub-5 nm technologies, power distribution networks (PDNs) in integrated circuits have grown increasingly complex, with…”
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    Conference Proceeding
  7. 7

    Joint Cutting for Hybrid Schrödinger-Feynman Simulation of Quantum Circuits by Herzog, Laura S., Burgholzer, Lukas, Ufrecht, Christian, Scherer, Daniel D., Wille, Robert

    Published: IEEE 22.06.2025
    “…Despite the continuous advancements in size and robustness of real quantum devices, reliable large-scale quantum computers are not yet available. Hence,…”
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    Conference Proceeding
  8. 8

    Late Breaking Results: Opera: An Open and Efficient Platform for Data-driven Synthesis of Analog Circuits by Wang, Shikai, Hu, Yaolong, Yi, Zhiqiang, Chi, Taiyun, Cao, Weidong

    Published: IEEE 22.06.2025
    “…The front-end synthesis of analog circuits has been a long-standing challenge since the advent of integrated circuits. Many methods, ranging from conventional…”
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    Conference Proceeding
  9. 9

    Swift or Exact? Boosting Efficient Microarchitecture DSE via Multi-fidelity Partial Order Prediction by Liu, Hang, Geng, Hao, He, Zhuolun, Sun, Qi, Zhuo, Cheng

    Published: IEEE 22.06.2025
    “…A significant challenge in microarchitecture design space exploration (DSE) lies in the time-intensive synthesis and simulation process, making rapid design…”
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    Conference Proceeding
  10. 10

    Efficient Recycling Subspace Truncation Method for Periodic Small-Signal Analysis by Xu, Yuncheng, Yang, Fan, Su, Yangfeng

    Published: IEEE 22.06.2025
    “…Periodic small-signal analysis is crucial but timeconsuming in RF simulation, since it may deal with many frequency points. While the Krylov subspace recycling…”
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    Conference Proceeding
  11. 11

    Invited: Bambu: an Open-Source Research Framework for the High-Level Synthesis of Complex Applications by Ferrandi, Fabrizio, Castellana, Vito Giovanni, Curzel, Serena, Fezzardi, Pietro, Fiorito, Michele, Lattuada, Marco, Minutoli, Marco, Pilato, Christian, Tumeo, Antonino

    Published: IEEE 05.12.2021
    “…This paper presents the open-source high-level synthesis (HLS) research framework Bambu. Bambu provides a research environment to experiment with new ideas…”
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    Conference Proceeding
  12. 12

    YAP: Yield Modeling and Simulation for Advanced Packaging by Chen, Zhichao, Gupta, Puneet

    Published: IEEE 22.06.2025
    “…Three-dimensional integration technologies present a promising path forward for extending Moore's law, facilitating high-density interconnects between chips…”
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    Conference Proceeding
  13. 13

    Fast End-to-End Simulation and Exploration of Many-RISCV-Core Baseband Transceivers for Software-Defined Radio-Access Networks by Bertuletti, Marco, Zhang, Yichao, Abdollahpour, Mahdi, Riedel, Samuel, Vanelli-Coralli, Alessandro, Benini, Luca

    Published: IEEE 22.06.2025
    “…The fast-rising demand for wireless bandwidth [1] requires rapid evolution of high-performance baseband processing infrastructure. Programmable many-core…”
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    Conference Proceeding
  14. 14

    Accelerating design-technology co-development using neural compact modeling and data-driven SPICE simulation by Lee, Yongjeong, Lee, Seungsoo, Kim, Jeongyeol, Choi, Jungyun, Li, Zhaojie, Wu, Dehuang, Wang, Joddy

    Published: IEEE 22.06.2025
    “…This paper proposes a new design-technology cooptimization framework that expedites circuit optimization by utilizing the neural compact modeling (NCM) and a…”
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    Conference Proceeding
  15. 15

    SDM-PEB: Spatial-Depthwise Mamba for Enhanced Post-Exposure Bake Simulation by Yu, Ziyang, Xu, Peng, Wang, Zixiao, Zhu, Binwu, Wang, Qipan, Lin, Yibo, Wang, Runsheng, Yu, Bei, Wong, Martin

    Published: IEEE 22.06.2025
    “…The post-exposure bake (PEB) process is a critical step in semiconductor lithography, directly impacting resist profile accuracy and circuit pattern fidelity…”
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    Conference Proceeding
  16. 16

    PiSPICE: Accelerating Post-Layout SPICE Simulation via Essential Parasitic Identification by Jin, Zhou, Li, Jing, Xin, Jian, Zhou, Tianjia, Wu, Xiao, Niu, Dan, Ye, Zuochang

    Published: IEEE 22.06.2025
    “…As process nodes scale to more advanced technologies, post-layout simulations for integrated circuits have become increasingly complex, involving billions to…”
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    Conference Proceeding
  17. 17

    ATLAS: A Self-Supervised and Cross-Stage Netlist Power Model for Fine-Grained Time-Based Layout Power Analysis by Li, Wenkai, Lu, Yao, Fang, Wenji, Wang, Jing, Zhang, Qijun, Xie, Zhiyao

    Published: IEEE 22.06.2025
    “…Accurate power prediction in VLSI design is crucial for effective power optimization, especially as designs get transformed from gate-level netlist to layout…”
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    Conference Proceeding
  18. 18

    Generative Model Based Standard Cell Timing Library Characterization by Wu, Hao-Yu, Chang, Hsin-Tzu, Ding, Shiuan-Yun, Jiang, Iris Hui-Ru, Tsao, Benson, Wu, Vinson, Shih, Wei-Kai

    Published: IEEE 22.06.2025
    “…Accurate cell timing characterization is essential, on which static timing analysis relies to verify timing performance and ensure design robustness across…”
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    Conference Proceeding
  19. 19

    Self-Attention to Operator Learning-based 3D-IC Thermal Simulation by Huang, Zhen, Wang, Hong, Yang, Wenkai, Tang, Muxi, Xie, Depeng, Lin, Ting-Jung, Zhang, Yu, Xing, Wei W., He, Lei

    Published: IEEE 22.06.2025
    “…Thermal management in 3D ICs is increasingly challenging due to higher power densities. Traditional PDESolving based methods, while accurate, are too slow for…”
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    Conference Proceeding
  20. 20

    INSIGHT: A Universal Neural Simulator Framework for Analog Circuits with Autoregressive Transformers by Poddar, Souradip, Oh, Youngmin, Lai, Yao, Zhu, Hanqing, Hwang, Bosun, Pan, David Z.

    Published: IEEE 22.06.2025
    “…The compute-intensive nature of SPICE simulations hinders effective analog design automation. This paper introduces INSIGHT, a data-efficient, adaptive,…”
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    Conference Proceeding