Výsledky vyhledávání - "Hardware Hardware test Test-pattern generation and fault simulation"

Invited: Enhancing Test Quality by Targeting Timing Marginalities Due to Process Variations Autor Singh, Adit D., Faridi, Mukarram Ali

“… However, transistors fabricated in advanced technologies are subject to increasing random process variations that can significantly impact multiple devices, and result in highly nonlinear circuit…”
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