Výsledky vyhledávání - "Extended MC integration algorithm"

Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors Autor Hao, Songhua, Yang, Jun, Berenguer, Christophe

“…•Extend traditional IG process by incorporating skew-normal random effects.•Derive analytically the lifetime distribution for the proposed EIG process…”
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