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  1. 1

    Challenges on designing electrostatic discharge protection solutions for low power electronics by Liou, Juin J.

    ISBN: 1479912352, 9781479912353
    Published: Piscataway, NJ, USA IEEE Press 04.09.2013
    “…]. When a microchip or electronic system is subject to an ESD event, the huge ESD-induced current can likely damage the microchip and cause malfunction to the electronic system if the heat generated…”
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    Conference Proceeding
  2. 2

    Fast power/ground network optimization based on equivalent circuit modeling by Tan, X.-D. Sheldon, Shi, C.-J. Richard

    ISBN: 1581132972, 9781581132977
    ISSN: 0738-100X
    Published: New York, NY, USA ACM 01.01.2001
    Published in Design Automation, 2001 Proceedings (01.01.2001)
    “…This paper presents an efficient algorithm for optimizing the area of power or ground networks in integrated circuits subject to the reliability constraints…”
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    Conference Proceeding
  3. 3

    Efficient multiple-bit retention register assignment for power gated design: concept and algorithms by Chen, Yu-Guang, Shi, Yiyu, Lai, Kuan-Yu, Hui, Geng, Chang, Shih-Chieh

    ISBN: 9781450315739, 1450315739
    ISSN: 1092-3152
    Published: New York, NY, USA ACM 05.11.2012
    “…Retention registers have been widely used in power gated design to store data during sleep mode. Since they consume much larger area and power than normal…”
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    Conference Proceeding
  4. 4

    Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations by Li, Min, Davoodi, Azadeh, Xie, Lin

    ISBN: 3981080181, 9783981080186
    Published: San Jose, CA, USA EDA Consortium 12.03.2012
    “… which automatically generates the sensors subject to an area budget and available whitespace on the layout…”
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    Conference Proceeding
  5. 5

    Multiple tunable constant multiplications: algorithms and applications by Aksoy, Levent, Costa, Eduardo, Flores, Paulo, Monteiro, José

    ISBN: 9781450315739, 1450315739
    ISSN: 1092-3152
    Published: New York, NY, USA ACM 05.11.2012
    “… for the multiplication of multiple constants by an input variable, has been the subject of great interest since the complexity of many digital signal processing (DSP…”
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  6. 6

    Investigating the readability of state-based formal requirements specification languages by Zimmerman, Marc K., Lundqvist, Kristina, Leveson, Nancy

    ISBN: 158113472X, 9781581134728
    ISSN: 0270-5257
    Published: New York, NY, USA ACM 01.01.2002
    “…, the use of hierarchies, and transition perspective (going-to or coming-from). Subjects included computer scientists as well as aerospace engineers in an effort to determine whether background affects notational preferences…”
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    Conference Proceeding Journal Article
  7. 7

    Lattice QCD with domain decomposition on Intel® Xeon Phi™ co-processors by Heybrock, Simon, Joó, Bálint, Kalamkar, Dhiraj D., Smelyanskiy, Mikhail, Vaidyanathan, Karthikeyan, Wettig, Tilo, Dubey, Pradeep

    ISBN: 1479955000, 9781479955008
    ISSN: 2167-4329
    Published: Piscataway, NJ, USA IEEE Press 16.11.2014
    “…The gap between the cost of moving data and the cost of computing continues to grow, making it ever harder to design iterative solvers on extreme-scale…”
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  8. 8

    A new structural pattern matching algorithm for technology mapping by Zhao, Min, Sapatnekar, Sachin S.

    ISBN: 1581132972, 9781581132977
    ISSN: 0738-100X
    Published: New York, NY, USA ACM 01.01.2001
    Published in Design Automation, 2001 Proceedings (01.01.2001)
    “… The algorithm is based on a key observation that the matches for a node in a subject Boolean network are related to the matches for its children…”
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    Conference Proceeding
  9. 9

    Delay-optimal technology mapping by DAG covering by Kukimoto, Yuji, Brayton, Robert K., Sawkar, Prashant

    ISBN: 0897919645, 9780897919647
    Published: New York, NY, USA ACM 01.01.1998
    “… We show that subject graphs need not be decomposed into trees for delay minimization; they can be mapped directly as DAGs…”
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  10. 10

    Defect tolerant probabilistic design paradigm for nanotechnologies by Jacome, Margarida, He, Chen, de Veciana, Gustavo, Bijansky, Stephen

    ISBN: 1581138288, 9781581138283, 1511838288
    ISSN: 0738-100X
    Published: New York, NY, USA ACM 07.06.2004
    “…Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near…”
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  11. 11

    A submodular optimization approach to controlled islanding under cascading failure by Liu, Zhipeng, Clark, Andrew, Lee, Phillip, Bushnell, Linda, Kirschen, Daniel, Poovendran, Radha

    ISBN: 9781450349659, 145034965X
    Published: New York, NY, USA ACM 18.04.2017
    “…Cascading failures occur when the power system is subject to a significant disturbance, such as tripping one or more transmission lines…”
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  12. 12

    A hybrid strategy for mapping multiple throughput-constrained applications on MPSoCs by Singh, Amit Kumar, Kumar, Akash, Srikanthan, Thambipillai

    ISBN: 9781450307130, 1450307132
    Published: New York, NY, USA ACM 09.10.2011
    “…Modern embedded systems are based on Multiprocessor-Systems-on-Chip (MPSoCs) to meet the strict timing deadlines of multiple applications. MPSoC resources must…”
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  13. 13

    A Novel Entropy Production Based Full-Chip TSV Fatigue Analysis by Wang, Tianchen, Samal, Sandeep Kumar, Lim, Sung Kyu, Shi, Yiyu

    ISBN: 1467383899, 9781467383899
    Published: Piscataway, NJ, USA IEEE Press 02.11.2015
    “…Through-silicon vias (TSVs) are subject to thermal fatigue due to stress over time, no matter how small the stress…”
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    Conference Proceeding
  14. 14

    ToPoliNano: nanoarchitectures design made real by Frache, S., Chiabrando, D., Graziano, M., Riente, F., Turvani, G., Zamboni, M.

    ISBN: 1450316719, 9781450316712
    ISSN: 2327-8218
    Published: New York, NY, USA ACM 04.07.2012
    “… Researchers face problems that are not new per se, but are now subject to very different constraints, that need to be captured by design tools…”
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  15. 15

    Communication Scheduling and Buslet Synthesis for Low-Interconnect HLS Designs by Tartaglione, Enzo, Dutt, Shantanu

    ISBN: 1467383899, 9781467383899
    Published: Piscataway, NJ, USA IEEE Press 02.11.2015
    “…Current nanoscale designs are highly interconnect dominated, taking about 70% of the chip area. Interconnects also consume significant dynamic power, and about…”
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  16. 16

    Power/Ground Mesh Area Optimization Using Multigrid-Based Technique by Wang, Kai, Marek-Sadowska, Malgorzata

    ISBN: 0769518702, 9780769518701
    ISSN: 1530-1591
    Published: Washington, DC, USA IEEE Computer Society 03.03.2003
    “…In this paper, we present a novel multigrid-based technique for power/ground mesh area optimization subject to reliability constraints…”
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  17. 17

    Impact of nanomanufacturing flow on systematic yield losses in nanoscale fabrics by Vijayakumar, Priyamvada, Narayanan, Pritish, Koren, Israel, Mani Krishna, C., Moritz, Csaba Andras

    ISBN: 1457709937, 9781457709937
    ISSN: 2327-8218
    Published: Washington, DC, USA IEEE Computer Society 08.06.2011
    “… A bottom-up fabrication of nanoelectronic circuits is expected to be subject to various defects and identifying the types of defects that may occur during each step of a manufacturing pathway…”
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  18. 18

    Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation by Chen, Chung-Ping, Chu, Chris C. N., Wong, D. F.

    ISBN: 1581130082, 9781581130089
    ISSN: 1092-3152
    Published: New York, NY, USA ACM 1998
    “… We present a fast and exact algorithm which can minimize total area subject to maximum delay bound…”
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    Conference Proceeding Journal Article
  19. 19

    Policy optimization for dynamic power management by Paleologo, G. A., Benini, L., Bogliolo, A., De Micheli, G.

    ISBN: 0897919645, 9780897919647
    Published: New York, NY, USA ACM 01.05.1998
    “… Furthermore, we show that the fundamental problem of finding an optimal policy which maximizes the average performance level of a system, subject to a constraint on the power consumption…”
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  20. 20

    Joint design-time and post-silicon optimization for digitally tuned analog circuits by Wei Yao, Yiyu Shi, Lei He, Pamarti, S.

    ISSN: 1092-3152
    Published: IEEE 01.11.2009
    “… In this paper we formulate the co-optimization problem for digitally tuned analog circuits to optimize the parametric yield, subject to power and area constraints…”
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