Výsledky vyhledávání - "Applied computing Physical sciences and engineering Electronics"

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  1. 1

    Challenges on designing electrostatic discharge protection solutions for low power electronics Autor Liou, Juin J.

    ISBN: 1479912352, 9781479912353
    Vydáno: Piscataway, NJ, USA IEEE Press 04.09.2013
    “…]. When a microchip or electronic system is subject to an ESD event, the huge ESD-induced current can likely damage the microchip and cause malfunction to the electronic system if the heat generated…”
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  2. 2

    Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations Autor Li, Min, Davoodi, Azadeh, Xie, Lin

    ISBN: 3981080181, 9783981080186
    Vydáno: San Jose, CA, USA EDA Consortium 12.03.2012
    “… which automatically generates the sensors subject to an area budget and available whitespace on the layout…”
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  3. 3

    Fast power/ground network optimization based on equivalent circuit modeling Autor Tan, X.-D. Sheldon, Shi, C.-J. Richard

    ISBN: 1581132972, 9781581132977
    ISSN: 0738-100X
    Vydáno: New York, NY, USA ACM 01.01.2001
    Vydáno v Design Automation, 2001 Proceedings (01.01.2001)
    “…This paper presents an efficient algorithm for optimizing the area of power or ground networks in integrated circuits subject to the reliability constraints…”
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  4. 4

    A new structural pattern matching algorithm for technology mapping Autor Zhao, Min, Sapatnekar, Sachin S.

    ISBN: 1581132972, 9781581132977
    ISSN: 0738-100X
    Vydáno: New York, NY, USA ACM 01.01.2001
    Vydáno v Design Automation, 2001 Proceedings (01.01.2001)
    “… The algorithm is based on a key observation that the matches for a node in a subject Boolean network are related to the matches for its children…”
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  5. 5

    ToPoliNano: nanoarchitectures design made real Autor Frache, S., Chiabrando, D., Graziano, M., Riente, F., Turvani, G., Zamboni, M.

    ISBN: 1450316719, 9781450316712
    ISSN: 2327-8218
    Vydáno: New York, NY, USA ACM 04.07.2012
    “… Researchers face problems that are not new per se, but are now subject to very different constraints, that need to be captured by design tools…”
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  6. 6

    Power/Ground Mesh Area Optimization Using Multigrid-Based Technique Autor Wang, Kai, Marek-Sadowska, Malgorzata

    ISBN: 0769518702, 9780769518701
    ISSN: 1530-1591
    Vydáno: Washington, DC, USA IEEE Computer Society 03.03.2003
    “…In this paper, we present a novel multigrid-based technique for power/ground mesh area optimization subject to reliability constraints…”
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  7. 7

    Impact of nanomanufacturing flow on systematic yield losses in nanoscale fabrics Autor Vijayakumar, Priyamvada, Narayanan, Pritish, Koren, Israel, Mani Krishna, C., Moritz, Csaba Andras

    ISBN: 1457709937, 9781457709937
    ISSN: 2327-8218
    Vydáno: Washington, DC, USA IEEE Computer Society 08.06.2011
    “… A bottom-up fabrication of nanoelectronic circuits is expected to be subject to various defects and identifying the types of defects that may occur during each step of a manufacturing pathway…”
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  8. 8

    Power optimization and management in embedded systems Autor Pedram, Massoud

    ISBN: 0780366344, 9780780366343
    Vydáno: New York, NY, USA ACM 30.01.2001
    “…Power-efficient design requires reducing power dissipation in all parts of the design and during all stages of the design process subject to constraints on the system performance and quality of service (QoS…”
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  9. 9

    Policy optimization for dynamic power management Autor Paleologo, G. A., Benini, L., Bogliolo, A., De Micheli, G.

    ISBN: 0897919645, 9780897919647
    Vydáno: New York, NY, USA ACM 01.05.1998
    “… Furthermore, we show that the fundamental problem of finding an optimal policy which maximizes the average performance level of a system, subject to a constraint on the power consumption…”
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  10. 10

    A physical alpha-power law MOSFET model Autor Bowman, Keith A., Austin, Blanca L., Eble, John C., Tang, Xinghai, Meindl, James D.

    ISBN: 158113133X, 9781581131338
    Vydáno: New York, NY, USA ACM 17.08.1999
    “…) threshold voltage roll-off. Model projections for MOSFET CV/I indicate a 2X-performance opportunity compared to NTRS extrapolations for the 250, 180, and 150 nm generations subject to maximum leakage current estimates of the roadmap…”
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  11. 11

    Tutorial: reading and reviewing the common schema for electrical design and analysis Autor Parks, C. H.

    ISBN: 9780818607813, 0818607815
    ISSN: 0738-100X
    Vydáno: New York, NY, USA ACM 01.10.1987
    “… Reviews are now required for consensus by technical experts who are also familiar with this subject matter…”
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