Výsledky vyhledávání - "Applied computing Physical sciences and engineering Electronics"
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Challenges on designing electrostatic discharge protection solutions for low power electronics
ISBN: 1479912352, 9781479912353Vydáno: Piscataway, NJ, USA IEEE Press 04.09.2013Vydáno v Proceedings of the 2013 International Symposium on Low Power Electronics and Design (04.09.2013)“…]. When a microchip or electronic system is subject to an ESD event, the huge ESD-induced current can likely damage the microchip and cause malfunction to the electronic system if the heat generated…”
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Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations
ISBN: 3981080181, 9783981080186Vydáno: San Jose, CA, USA EDA Consortium 12.03.2012Vydáno v Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)“… which automatically generates the sensors subject to an area budget and available whitespace on the layout…”
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3
Fast power/ground network optimization based on equivalent circuit modeling
ISBN: 1581132972, 9781581132977ISSN: 0738-100XVydáno: New York, NY, USA ACM 01.01.2001Vydáno v Design Automation, 2001 Proceedings (01.01.2001)“…This paper presents an efficient algorithm for optimizing the area of power or ground networks in integrated circuits subject to the reliability constraints…”
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A new structural pattern matching algorithm for technology mapping
ISBN: 1581132972, 9781581132977ISSN: 0738-100XVydáno: New York, NY, USA ACM 01.01.2001Vydáno v Design Automation, 2001 Proceedings (01.01.2001)“… The algorithm is based on a key observation that the matches for a node in a subject Boolean network are related to the matches for its children…”
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5
ToPoliNano: nanoarchitectures design made real
ISBN: 1450316719, 9781450316712ISSN: 2327-8218Vydáno: New York, NY, USA ACM 04.07.2012Vydáno v 2012 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH) (04.07.2012)“… Researchers face problems that are not new per se, but are now subject to very different constraints, that need to be captured by design tools…”
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Power/Ground Mesh Area Optimization Using Multigrid-Based Technique
ISBN: 0769518702, 9780769518701ISSN: 1530-1591Vydáno: Washington, DC, USA IEEE Computer Society 03.03.2003Vydáno v Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 (03.03.2003)“…In this paper, we present a novel multigrid-based technique for power/ground mesh area optimization subject to reliability constraints…”
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Impact of nanomanufacturing flow on systematic yield losses in nanoscale fabrics
ISBN: 1457709937, 9781457709937ISSN: 2327-8218Vydáno: Washington, DC, USA IEEE Computer Society 08.06.2011Vydáno v 2011 IEEE/ACM International Symposium on Nanoscale Architectures (08.06.2011)“… A bottom-up fabrication of nanoelectronic circuits is expected to be subject to various defects and identifying the types of defects that may occur during each step of a manufacturing pathway…”
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Power optimization and management in embedded systems
ISBN: 0780366344, 9780780366343Vydáno: New York, NY, USA ACM 30.01.2001Vydáno v Proceedings of the 2001 Asia and South Pacific Design Automation Conference (30.01.2001)“…Power-efficient design requires reducing power dissipation in all parts of the design and during all stages of the design process subject to constraints on the system performance and quality of service (QoS…”
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Policy optimization for dynamic power management
ISBN: 0897919645, 9780897919647Vydáno: New York, NY, USA ACM 01.05.1998Vydáno v DAC 98: DAC: 35th Annual ACM/IEEE Design Automation Conference (01.05.1998)“… Furthermore, we show that the fundamental problem of finding an optimal policy which maximizes the average performance level of a system, subject to a constraint on the power consumption…”
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A physical alpha-power law MOSFET model
ISBN: 158113133X, 9781581131338Vydáno: New York, NY, USA ACM 17.08.1999Vydáno v Low Power Electronics and Design 1999: Proceedings of the 1999 International Symposium (17.08.1999)“…) threshold voltage roll-off. Model projections for MOSFET CV/I indicate a 2X-performance opportunity compared to NTRS extrapolations for the 250, 180, and 150 nm generations subject to maximum leakage current estimates of the roadmap…”
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Tutorial: reading and reviewing the common schema for electrical design and analysis
ISBN: 9780818607813, 0818607815ISSN: 0738-100XVydáno: New York, NY, USA ACM 01.10.1987Vydáno v 24th ACM/IEEE Design Automation Conference (01.10.1987)“… Reviews are now required for consensus by technical experts who are also familiar with this subject matter…”
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