Výsledky vyhľadávania - "Applied computing Physical sciences and engineering"
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Challenges on designing electrostatic discharge protection solutions for low power electronics
ISBN: 1479912352, 9781479912353Vydavateľské údaje: Piscataway, NJ, USA IEEE Press 04.09.2013Vydané v Proceedings of the 2013 International Symposium on Low Power Electronics and Design (04.09.2013)“…]. When a microchip or electronic system is subject to an ESD event, the huge ESD-induced current can likely damage the microchip and cause malfunction to the electronic system if the heat generated…”
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Fast power/ground network optimization based on equivalent circuit modeling
ISBN: 1581132972, 9781581132977ISSN: 0738-100XVydavateľské údaje: New York, NY, USA ACM 01.01.2001Vydané v Design Automation, 2001 Proceedings (01.01.2001)“…This paper presents an efficient algorithm for optimizing the area of power or ground networks in integrated circuits subject to the reliability constraints…”
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3
Efficient multiple-bit retention register assignment for power gated design: concept and algorithms
ISBN: 9781450315739, 1450315739ISSN: 1092-3152Vydavateľské údaje: New York, NY, USA ACM 05.11.2012Vydané v 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (05.11.2012)“…Retention registers have been widely used in power gated design to store data during sleep mode. Since they consume much larger area and power than normal…”
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4
Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations
ISBN: 3981080181, 9783981080186Vydavateľské údaje: San Jose, CA, USA EDA Consortium 12.03.2012Vydané v Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)“… which automatically generates the sensors subject to an area budget and available whitespace on the layout…”
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Multiple tunable constant multiplications: algorithms and applications
ISBN: 9781450315739, 1450315739ISSN: 1092-3152Vydavateľské údaje: New York, NY, USA ACM 05.11.2012Vydané v 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (05.11.2012)“… for the multiplication of multiple constants by an input variable, has been the subject of great interest since the complexity of many digital signal processing (DSP…”
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Investigating the readability of state-based formal requirements specification languages
ISBN: 158113472X, 9781581134728ISSN: 0270-5257Vydavateľské údaje: New York, NY, USA ACM 01.01.2002Vydané v Proceedings - International Conference on Software Engineering (01.01.2002)“…, the use of hierarchies, and transition perspective (going-to or coming-from). Subjects included computer scientists as well as aerospace engineers in an effort to determine whether background affects notational preferences…”
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7
Lattice QCD with domain decomposition on Intel® Xeon Phi™ co-processors
ISBN: 1479955000, 9781479955008ISSN: 2167-4329Vydavateľské údaje: Piscataway, NJ, USA IEEE Press 16.11.2014Vydané v Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis (16.11.2014)“…The gap between the cost of moving data and the cost of computing continues to grow, making it ever harder to design iterative solvers on extreme-scale…”
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A new structural pattern matching algorithm for technology mapping
ISBN: 1581132972, 9781581132977ISSN: 0738-100XVydavateľské údaje: New York, NY, USA ACM 01.01.2001Vydané v Design Automation, 2001 Proceedings (01.01.2001)“… The algorithm is based on a key observation that the matches for a node in a subject Boolean network are related to the matches for its children…”
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Delay-optimal technology mapping by DAG covering
ISBN: 0897919645, 9780897919647Vydavateľské údaje: New York, NY, USA ACM 01.01.1998Vydané v DAC 98: DAC: 35th Annual ACM/IEEE Design Automation Conference (01.01.1998)“… We show that subject graphs need not be decomposed into trees for delay minimization; they can be mapped directly as DAGs…”
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Defect tolerant probabilistic design paradigm for nanotechnologies
ISBN: 1581138288, 9781581138283, 1511838288ISSN: 0738-100XVydavateľské údaje: New York, NY, USA ACM 07.06.2004Vydané v Proceedings - ACM IEEE Design Automation Conference (07.06.2004)“…Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near…”
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A submodular optimization approach to controlled islanding under cascading failure
ISBN: 9781450349659, 145034965XVydavateľské údaje: New York, NY, USA ACM 18.04.2017Vydané v 2017 ACM IEEE 8th International Conference on Cyber Physical Systems (ICCPS) (18.04.2017)“…Cascading failures occur when the power system is subject to a significant disturbance, such as tripping one or more transmission lines…”
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A hybrid strategy for mapping multiple throughput-constrained applications on MPSoCs
ISBN: 9781450307130, 1450307132Vydavateľské údaje: New York, NY, USA ACM 09.10.2011Vydané v Proceedings of the 14th International Conference on Compilers, Architectures and Synthesis for Embedded Systems (09.10.2011)“…Modern embedded systems are based on Multiprocessor-Systems-on-Chip (MPSoCs) to meet the strict timing deadlines of multiple applications. MPSoC resources must…”
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13
A Novel Entropy Production Based Full-Chip TSV Fatigue Analysis
ISBN: 1467383899, 9781467383899Vydavateľské údaje: Piscataway, NJ, USA IEEE Press 02.11.2015Vydané v Proceedings of the IEEE/ACM International Conference on Computer-Aided Design (02.11.2015)“…Through-silicon vias (TSVs) are subject to thermal fatigue due to stress over time, no matter how small the stress…”
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ToPoliNano: nanoarchitectures design made real
ISBN: 1450316719, 9781450316712ISSN: 2327-8218Vydavateľské údaje: New York, NY, USA ACM 04.07.2012Vydané v 2012 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH) (04.07.2012)“… Researchers face problems that are not new per se, but are now subject to very different constraints, that need to be captured by design tools…”
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Communication Scheduling and Buslet Synthesis for Low-Interconnect HLS Designs
ISBN: 1467383899, 9781467383899Vydavateľské údaje: Piscataway, NJ, USA IEEE Press 02.11.2015Vydané v Proceedings of the IEEE/ACM International Conference on Computer-Aided Design (02.11.2015)“…Current nanoscale designs are highly interconnect dominated, taking about 70% of the chip area. Interconnects also consume significant dynamic power, and about…”
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Power/Ground Mesh Area Optimization Using Multigrid-Based Technique
ISBN: 0769518702, 9780769518701ISSN: 1530-1591Vydavateľské údaje: Washington, DC, USA IEEE Computer Society 03.03.2003Vydané v Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 (03.03.2003)“…In this paper, we present a novel multigrid-based technique for power/ground mesh area optimization subject to reliability constraints…”
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Impact of nanomanufacturing flow on systematic yield losses in nanoscale fabrics
ISBN: 1457709937, 9781457709937ISSN: 2327-8218Vydavateľské údaje: Washington, DC, USA IEEE Computer Society 08.06.2011Vydané v 2011 IEEE/ACM International Symposium on Nanoscale Architectures (08.06.2011)“… A bottom-up fabrication of nanoelectronic circuits is expected to be subject to various defects and identifying the types of defects that may occur during each step of a manufacturing pathway…”
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Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation
ISBN: 1581130082, 9781581130089ISSN: 1092-3152Vydavateľské údaje: New York, NY, USA ACM 1998Vydané v Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design (1998)“… We present a fast and exact algorithm which can minimize total area subject to maximum delay bound…”
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Policy optimization for dynamic power management
ISBN: 0897919645, 9780897919647Vydavateľské údaje: New York, NY, USA ACM 01.05.1998Vydané v DAC 98: DAC: 35th Annual ACM/IEEE Design Automation Conference (01.05.1998)“… Furthermore, we show that the fundamental problem of finding an optimal policy which maximizes the average performance level of a system, subject to a constraint on the power consumption…”
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20
Joint design-time and post-silicon optimization for digitally tuned analog circuits
ISSN: 1092-3152Vydavateľské údaje: IEEE 01.11.2009Vydané v 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (01.11.2009)“… In this paper we formulate the co-optimization problem for digitally tuned analog circuits to optimize the parametric yield, subject to power and area constraints…”
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