Výsledky vyhledávání - Computer process Testing.

Complete Guide to Test Automation Techniques, Practices, and Patterns for Building and Maintaining Effective Software Projects / Autor Axelrod, Arnon

Ruby Data Processing Using Map, Reduce, and Select / Autor Godse, Jay

Innovations in Wave Processes Modelling and Decision Making Grid-Characteristic Method and Applications /

Advance Compression and Watermarking Technique for Speech Signals Autor Thanki, Rohit

Theory of Nonparametric Tests Autor Dickhaus, Thorsten

Machine Learning Methods for Behaviour Analysis and Anomaly Detection in Video Autor Isupova, Olga

Advances in group processes.

A Hybrid Approach for Power Plant Fault Diagnostics Autor Lemma, Tamiru Alemu

Recent Advances in Computational Optimization Results of the Workshop on Computational Optimization WCO 2016 /

Simulation and Inference for Stochastic Processes with YUIMA A Comprehensive R Framework for SDEs and Other Stochastic Processes / Autor Iacus, Stefano M.

Web Microanalysis of Big Image Data Autor Bajcsy, Peter

Software Development From A to Z A Deep Dive into all the Roles Involved in the Creation of Software / Autor Filipova, Olga

Building Your Online Store With WordPress and WooCommerce Learn to Leverage the Critical Role E-commerce Plays in Today's Competitive Marketplace / Autor Sims, Lisa

Industrial X-Ray Computed Tomography

Obsah: “…Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications.…”

Monte Carlo and Quasi-Monte Carlo Methods MCQMC 2016, Stanford, CA, August 14-19 /

Obsah: “…Sloan, Combining Sparse Grids, Multilevel MC and QMC for Elliptic PDEs with Random Coefficients -- Hiroshi Haramoto and Makoto Matsumoto, A Method to Compute an Appropriate Sample Size of a Two-Level Test for the NIST Test Suite -- Stefan Heinrich, Lower Complexity Bounds for Parametric Stochastic Itoˆ Integration -- Lukas Herrmann and Christoph Schwab, QMC Algorithms with Product Weights for Lognormal-Parametric, Elliptic PDEs -- Masatake Hirao, QMC Designs and Determinantal Point Processes -- Adam W. …”

Statistics and Simulation IWS 8, Vienna, Austria, September 2015 /

Security with Intelligent Computing and Big-data Services

Cyber Physical Computing for IoT-driven Services Autor Hahanov, Vladimir

Pro JPA 2 in Java EE 8 An In-Depth Guide to Java Persistence APIs / Autor Keith, Mike

Practical JSF in Java EE 8 Web Applications ​in Java for the Enterprise / Autor Müller, Michael