Defects in silicon : Proceedings of symp. B on science and technology of the 1989 E-MRS conf., Strasbourg, France, 30 May - 2 June 1989 /

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Bibliographic Details
Main Author: Chantre, A.
Corporate Author: Proceedings of symp. B on science and technology of the 1989 E-MRS conf. France, Strasbourg
Other Authors: Ammerlaan, C. A. J. (Editor), Wagner, P.
Format: Conference Proceeding Book
Language:English
Published: Amsterdam : North-Holland Publishing, 1989
Edition:[1st ed.]
Series:European Materials Research Society symposia proceedings Vol. 9
Subjects:
ISBN:0444886192
Online Access: Get full text
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