Optical characterization of epitaxial semiconductor layers /

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Bibliographic Details
Main Author: Bauer, Günther
Other Authors: Richter, Wolfgang
Format: Book
Language:English
Published: Berlin : Springer, 1996
Edition:[1st ed.]
Subjects:
spektroskopická elipsometria > Ramanova spektroskopia
ISBN:354059129X
Online Access: Get full text
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