Andersson, G. I. (1992). The influence of process-induced defects on electrical properties of silicon junctions. Chalmers Tekniska Högskola.
Chicago-Zitierstil (17. Ausg.)Andersson, Gert Ingvar. The Influence of Process-induced Defects on Electrical Properties of Silicon Junctions. Göteborg: Chalmers Tekniska Högskola, 1992.
MLA-Zitierstil (9. Ausg.)Andersson, Gert Ingvar. The Influence of Process-induced Defects on Electrical Properties of Silicon Junctions. Chalmers Tekniska Högskola, 1992.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.