Defect recognition and image processing im 3-5 compounds : DRIP 1985, Montpellier, France, July 2 - 4, 1985 /

Saved in:
Bibliographic Details
Main Author: Ogawa, Tomoya
Corporate Author: DRIP 1985 France, Montpellier
Format: Conference Proceeding Book
Language:English
Published: Amsterdam : Elsevier, 1985
Series:Materials science monographs Vol. 31
Subjects:
metalurgia
Online Access: Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first

Similar Items