Applications of electron microfractography to materials research : 73rd Annual Meeting, Toronto, Ontario, Canada, 21 - 26 June 1970 /

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Bibliographic Details
Main Author: Brothers, A. J.
Corporate Author: 73rd Annual Meeting Canada, Toronto, Ontario
Format: Conference Proceeding Book
Language:English
Published: Philadelphia : American Society for Testing and Materials, 1971
Series:ASTM Special Technical Publ. Nr. 493
Online Access: Get full text
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