Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces /
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| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
Delft :
Technická univerzita,
1990
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| 041 | 0 | |a eng | |
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| 100 | 1 | |a Jong, Alan Frank de | |
| 242 | 1 | 0 | |a Interpretácia obrazov prenosovej elektrónovej mikroskopie tenkých polovodičových vrstiev a fázových rozhraní |
| 245 | 1 | 0 | |a Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces / |c Alan Frank de Jong |
| 260 | |a Delft : |b Technická univerzita, |c 1990 | ||
| 300 | |a 185 s. : |b fotogr., grafy, lit., obr., tab. ; | ||
| 502 | |d 18. 6. 1990 | ||
| 692 | |a JM MM | ||
| 910 | |b A520165 | ||
| 974 | |f Knihy | ||
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| 999 | |c 30604 |d 30604 | ||