Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces /
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
Delft :
Technická univerzita,
1990
|
| Online Access: |
|
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Physical Description: | 185 s. : fotogr., grafy, lit., obr., tab. ; |
|---|