Jong, A. F. d. (1990). Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces. Technická univerzita.
Chicago Style (17th ed.) CitationJong, Alan Frank de. Image Interpretation for Transmission Electron Microscopy of Thin Semiconductor Layers and Interfaces. Delft: Technická univerzita, 1990.
MLA (9th ed.) CitationJong, Alan Frank de. Image Interpretation for Transmission Electron Microscopy of Thin Semiconductor Layers and Interfaces. Technická univerzita, 1990.
Warning: These citations may not always be 100% accurate.