Transmission electron microscopy of InxGa1-xAs/GaAs strained-layer structures /
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| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Göteborg :
Chalmers Tekniska Högskola,
1990
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| ISBN: | 9170325103 |
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| 100 | 1 | |a Yao, ji-Yong | |
| 242 | 1 | 0 | |a Prenosová elektrónová mikroskopia štruktúr s InxGa1-xAs/GaAs s namáhanou vrstvou |
| 245 | 1 | 0 | |a Transmission electron microscopy of InxGa1-xAs/GaAs strained-layer structures / |c ji-Yong Yao |
| 260 | |a Göteborg : |b Chalmers Tekniska Högskola, |c 1990 | ||
| 300 | |a Preruš. str. : |b grafy, lit., obr., tab. ; | ||
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