Yao, j. (1990). Transmission electron microscopy of InxGa1-xAs/GaAs strained-layer structures. Chalmers Tekniska Högskola.
Chicago Style (17th ed.) CitationYao, ji-Yong. Transmission Electron Microscopy of InxGa1-xAs/GaAs Strained-layer Structures. Göteborg: Chalmers Tekniska Högskola, 1990.
MLA (9th ed.) CitationYao, ji-Yong. Transmission Electron Microscopy of InxGa1-xAs/GaAs Strained-layer Structures. Chalmers Tekniska Högskola, 1990.
Warning: These citations may not always be 100% accurate.