Defect and fault tolerance in VLSI systems. Vol. 1 : Proceedings of the international workshop, Springfield, Massachusetts, Oct. 6 - 7, 1988 /

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Bibliographic Details
Main Author: Koren, Israel
Corporate Author: Proceedings of the international workshop Massachusetts, Springfield
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, 1989
ISBN:0306432242
Online Access: Get full text
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