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Defect and fault tolerance in VLSI systems. Vol. 1 : Proceedings of the international workshop, Springfield, Massachusetts, Oct. 6 - 7, 1988 /

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Hlavní autor:	Koren, Israel
Korporativní autor:	Proceedings of the international workshop Massachusetts, Springfield
Médium:	Konferenční příspěvek Kniha
Jazyk:	angličtina
Vydáno:	New York : Plenum Press, 1989
ISBN:	0306432242
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