Defect and fault tolerance in VLSI systems. Vol. 1 : Proceedings of the international workshop, Springfield, Massachusetts, Oct. 6 - 7, 1988 /
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| Main Author: | |
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| Corporate Author: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
New York :
Plenum Press,
1989
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| ISBN: | 0306432242 |
| Online Access: |
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| 100 | 1 | |a Koren, Israel | |
| 111 | 0 | |a Proceedings of the international workshop |d (Oct. 6 - 7, 1988 : |c Massachusetts, Springfield) | |
| 242 | 1 | 0 | |a Tolerancia chýb a porúch v systémoch integrovaných obvodov. Časť 1 |
| 245 | 1 | 0 | |a Defect and fault tolerance in VLSI systems. Vol. 1 : |b Proceedings of the international workshop, Springfield, Massachusetts, Oct. 6 - 7, 1988 / |c Authors: Israel Koren and Co. |
| 260 | |a New York : |b Plenum Press, |c 1989 | ||
| 300 | |a 12, 362 s. : |b fotogr., grafy, lit., obr., tab. ; | ||
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