Defect and fault tolerance in VLSI systems. Vol. 1 : Proceedings of the international workshop, Springfield, Massachusetts, Oct. 6 - 7, 1988 /
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
New York :
Plenum Press,
1989
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| ISBN: | 0306432242 |
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| Physical Description: | 12, 362 s. : fotogr., grafy, lit., obr., tab. ; |
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| ISBN: | 0306432242 |