Industrial X-Ray Computed Tomography

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and sof...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Format: Elektronisch E-Book
Sprache:Englisch
Veröffentlicht: Cham : Springer International Publishing, 2018.
Ausgabe:1st ed. 2018.
Schlagworte:
Materials science.
Manufactures.
Optical materials.
Electronic materials.
Atoms.
Physics.
ISBN:9783319595733
Online-Zugang: Volltext
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Inhaltsangabe:
  • Introduction
  • Principles of X-ray computed tomography
  • Technical concepts and components
  • Processing and visualization of CT data
  • Computer simulation
  • Error sources
  • Performance verification
  • Traceability of CT dimensional measurements
  • CT for non-destructive testing and materials characterization
  • CT for dimensional metrology
  • Other industrial applications.

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