Industrial X-Ray Computed Tomography

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and sof...

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Médium: Elektronický zdroj E-kniha
Jazyk:English
Vydavateľské údaje: Cham : Springer International Publishing, 2018.
Vydanie:1st ed. 2018.
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ISBN:9783319595733
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245 1 0 |a Industrial X-Ray Computed Tomography  |h [electronic resource] /  |c edited by Simone Carmignato, Wim Dewulf, Richard Leach. 
250 |a 1st ed. 2018. 
260 1 |a Cham :  |b Springer International Publishing,  |c 2018. 
300 |a VII, 369 p. 273 illus.  |b online resource. 
500 |a Chemistry and Materials Science  
505 0 |a Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications. 
516 |a text file PDF 
520 |a This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. 
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650 0 |a Manufactures. 
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650 0 |a Physics. 
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