EM Material Characterization Techniques for Metamaterials
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material chara...
Uloženo v:
| Hlavní autor: | |
|---|---|
| Médium: | Elektronický zdroj E-kniha |
| Jazyk: | angličtina |
| Vydáno: |
Singapore :
Springer Singapore ,
2018.
|
| Vydání: | 1st ed. 2018. |
| Edice: | SpringerBriefs in Computational Electromagnetics,
|
| Témata: | |
| ISBN: | 9789811065170 |
| ISSN: | 2365-6239 |
| On-line přístup: |
|
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|
MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 003 | SK-BrCVT | ||
| 005 | 20220618120559.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 170921s2018 si | s |||| 0|eng d | ||
| 020 | |a 9789811065170 | ||
| 024 | 7 | |a 10.1007/978-981-10-6517-0 |2 doi | |
| 035 | |a CVTIDW08810 | ||
| 040 | |a Springer-Nature |b eng |c CVTISR |e AACR2 | ||
| 041 | |a eng | ||
| 100 | 1 | |a Nair, Raveendranath U. |4 aut | |
| 245 | 1 | 0 | |a EM Material Characterization Techniques for Metamaterials |h [electronic resource] / |c by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu. |
| 250 | |a 1st ed. 2018. | ||
| 260 | 1 | |a Singapore : |b Springer Singapore , |c 2018. | |
| 300 | |a XXIII, 50 p. 18 illus., 12 illus. in color. |b online resource. | ||
| 490 | 1 | |a SpringerBriefs in Computational Electromagnetics, |x 2365-6239 | |
| 500 | |a Engineering | ||
| 516 | |a text file PDF | ||
| 520 | |a This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials . | ||
| 650 | 0 | |a Microwaves. | |
| 650 | 0 | |a Optical engineering. | |
| 650 | 0 | |a Optical materials. | |
| 650 | 0 | |a Electronic materials. | |
| 650 | 0 | |a Electrical engineering. | |
| 856 | 4 | 0 | |u http://hanproxy.cvtisr.sk/han/cvti-ebook-springer-eisbn-978-981-10-6517-0 |y Vzdialený prístup pre registrovaných používateľov |
| 910 | |b ZE06090 | ||
| 919 | |a 978-981-10-6517-0 | ||
| 974 | |a andrea.lebedova |f Elektronické zdroje | ||
| 992 | |a SUD | ||
| 999 | |c 275307 |d 275307 | ||