EM Material Characterization Techniques for Metamaterials

This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material chara...

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Hlavní autor: Nair, Raveendranath U. (Autor)
Médium: Elektronický zdroj E-kniha
Jazyk:angličtina
Vydáno: Singapore : Springer Singapore , 2018.
Vydání:1st ed. 2018.
Edice:SpringerBriefs in Computational Electromagnetics,
Témata:
Microwaves.
Optical engineering.
Optical materials.
Electronic materials.
Electrical engineering.
ISBN:9789811065170
ISSN:2365-6239
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Shrnutí:This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
Popis jednotky:Engineering
Fyzický popis:XXIII, 50 p. 18 illus., 12 illus. in color. online resource.
ISBN:9789811065170
ISSN:2365-6239

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