Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization /

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular...

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Bibliographic Details
Format: Electronic eBook
Language:English
Published: Cham : Springer International Publishing, 2018.
Edition:1st ed. 2018.
Series:Springer Series in Surface Sciences, 65
Subjects:
Spectroscopy.
Microscopy.
Materials-Surfaces.
Thin films.
Nanotechnology.
Materials science.
Physical measurements.
Measurement .
ISBN:9783319756875
ISSN:0931-5195 ;
Online Access: Get full text
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Table of Contents:
  • Part I: Technical aspects
  • Experimental technique and working modes
  • Dissipation KPFM
  • KPFM techniques for liquid environment
  • Open-loop and excitation KPFM
  • Quantitative KPFM on semiconductor devices
  • KPFM with atomic resolution.- KPFM with atomic resolution
  • Part II: Theoretical Aspects
  • Local dipoles in atomic and Kelvin probe force microscopy
  • Influence of the tip electrostatic field on high resolution KPFM measurements
  • Modelling the electrostatic field of a cantilever
  • Theory of open-loop KPFM
  • KPFM in a SPM simulator
  • Electrostatic interactions with dielectric samples
  • Part III: Applications
  • Kelvin spectroscopy of single molecules
  • KPFM for single molecule chemistry
  • Optoelectronic properties of single molecules
  • Quantitative KPFM of molecular self-assemblies
  • Applications of KPFM in liquids
  • KPFM of organic solar cell materials
  • Correlation of optical and electrical nanoscale properties of organic devices
  • KPFM for catalysis
  • Quantitative electrical measurements of SiC devices.

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