Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization /

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular...

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Format:	Elektronisch E-Book
Sprache:	Englisch
Veröffentlicht:	Cham : Springer International Publishing, 2018.
Ausgabe:	1st ed. 2018.
Schriftenreihe:	Springer Series in Surface Sciences, 65
Schlagworte:	Spectroscopy. Microscopy. Materials-Surfaces. Thin films. Nanotechnology. Materials science. Physical measurements. Measurement .
ISBN:	9783319756875
ISSN:	0931-5195 ;
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