APA (7th ed.) Citation

(2018). Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (1st ed. 2018.). Springer International Publishing.

Chicago Style (17th ed.) Citation

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization. 1st ed. 2018. Cham: Springer International Publishing, 2018.

MLA (9th ed.) Citation

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization. 1st ed. 2018. Springer International Publishing, 2018.

Warning: These citations may not always be 100% accurate.