Fundamentals of Electromigration-Aware Integrated Circuit Design
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensiv...
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| Hlavní autor: | |
|---|---|
| Médium: | Elektronický zdroj E-kniha |
| Jazyk: | angličtina |
| Vydáno: |
Cham :
Springer International Publishing,
2018.
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| Vydání: | 1st ed. 2018. |
| Témata: | |
| ISBN: | 9783319735580 |
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Obsah:
- Introduction
- Fundamentals of Electromigration
- Integrated Circuit Design and Electromigration
- Mitigating Electromigration in Physical Design
- Summary and Outlook.

