Ellipsometry of Functional Organic Surfaces and Films
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional o...
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| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | Englisch |
| Veröffentlicht: |
Cham :
Springer International Publishing,
2018.
|
| Ausgabe: | 2nd ed. 2018. |
| Schriftenreihe: | Springer Series in Surface Sciences,
52 |
| Schlagworte: | |
| ISBN: | 9783319758954 |
| ISSN: | 0931-5195 ; |
| Online-Zugang: |
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| 020 | |a 9783319758954 | ||
| 024 | 7 | |a 10.1007/978-3-319-75895-4 |2 doi | |
| 035 | |a CVTIDW08807 | ||
| 040 | |a Springer-Nature |b eng |c CVTISR |e AACR2 | ||
| 041 | |a eng | ||
| 245 | 1 | 0 | |a Ellipsometry of Functional Organic Surfaces and Films |h [electronic resource] / |c edited by Karsten Hinrichs, Klaus-Jochen Eichhorn. |
| 250 | |a 2nd ed. 2018. | ||
| 260 | 1 | |a Cham : |b Springer International Publishing, |c 2018. | |
| 300 | |a XXVI, 547 p. 314 illus., 156 illus. in color. |b online resource. | ||
| 490 | 1 | |a Springer Series in Surface Sciences, |x 0931-5195 ; |v 52 | |
| 500 | |a Physics and Astronomy | ||
| 505 | 0 | |a Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants. . | |
| 516 | |a text file PDF | ||
| 520 | |a This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions. | ||
| 650 | 0 | |a Surfaces (Physics). | |
| 650 | 0 | |a Interfaces (Physical sciences). | |
| 650 | 0 | |a Thin films. | |
| 650 | 0 | |a Materials-Surfaces. | |
| 650 | 0 | |a Physical chemistry. | |
| 650 | 0 | |a Lasers. | |
| 650 | 0 | |a Photonics. | |
| 650 | 0 | |a Materials science. | |
| 856 | 4 | 0 | |u http://hanproxy.cvtisr.sk/han/cvti-ebook-springer-eisbn-978-3-319-75895-4 |y Vzdialený prístup pre registrovaných používateľov |
| 910 | |b ZE06087 | ||
| 919 | |a 978-3-319-75895-4 | ||
| 974 | |a andrea.lebedova |f Elektronické zdroje | ||
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