Contactless VLSI Measurement and Testing Techniques

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approach...

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Hlavní autor: Sayil, Selahattin (Autor)
Médium: Elektronický zdroj E-kniha
Jazyk:angličtina
Vydáno: Cham : Springer International Publishing, 2018.
Vydání:1st ed. 2018.
Témata:
Electronic circuits.
Microprocessors.
Electronics.
Microelectronics.
ISBN:9783319696737
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Obsah:
  • 1. Conventional Test Methods. - 2. Testability Design
  • 3. Other Techniques Based on the Contacting Probe
  • 4. Contactless Testing
  • 5. Electron-Beam and Photoemission Probing
  • 6. Electro Optic Sampling and Charge Density Probe
  • 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe
  • 8. Probing Techniques Based on Light Emission from Chip
  • 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits
  • 10. Comparison of Contactless Testing Methodologies.

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