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Contactless VLSI Measurement and Testing Techniques

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approach...

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Podrobná bibliografie
Hlavní autor:	Sayil, Selahattin (Autor)
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	Cham : Springer International Publishing, 2018.
Vydání:	1st ed. 2018.
Témata:	Electronic circuits. Microprocessors. Electronics. Microelectronics.
ISBN:	9783319696737
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