APA (7th ed.) Citation

Sayil, S. (2018). Contactless VLSI Measurement and Testing Techniques (1st ed. 2018.). Springer International Publishing.

Chicago Style (17th ed.) Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Cham: Springer International Publishing, 2018.

MLA (9th ed.) Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing, 2018.

Warning: These citations may not always be 100% accurate.