(2013). Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology; A volume in Micro and Nano Technologies. Elsevier.
Citace podle Chicago (17th ed.)Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology; A Volume in Micro and Nano Technologies. : Elsevier, 2013.
Citace podle MLA (9th ed.)Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology; A Volume in Micro and Nano Technologies. Elsevier, 2013.
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