New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

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Bibliographic Details
Format: Book
Language:Slovak
Published: : Elsevier, 2014
Subjects:
ISBN:9780323241434
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245 1 0 |a New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices  |c Zalevsky, Zeev, Pavel Livshits, Eran gur  |h [elektronický zdroj] 
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653 1 |a fourier transform  |a image processing 
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