Citace podle APA (7th ed.)

(2014). New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices. Elsevier.

Citace podle Chicago (17th ed.)

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices. : Elsevier, 2014.

Citace podle MLA (9th ed.)

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices. Elsevier, 2014.

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