Modeling nanoscale imaging in electron microscopy /

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Bibliographic Details
Other Authors:	Vogt, Thomas (Editor), Dahmen, Wolfgang (Editor), Binev, Peter (Editor)
Format:	Book
Language:	English
Published:	New York, NY : Springer, 2012
Series:	Nanostructure science and technology
Subjects:	elektrónová mikroskopia nanoškálové zobrazovanie matematický model odborné publikácie
ISBN:	9781461421900
ISSN:	1571-5744
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Call Number:	A622973
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