Ultra Low Noise CMOS Image Sensors

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequent...

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Bibliographic Details
Main Author: Boukhayma, Assim (Author)
Format: Electronic eBook
Language:English
Published: Cham : Springer International Publishing, 2018.
Edition:1st ed. 2018.
Series:Springer Theses, Recognizing Outstanding Ph.D. Research,
Subjects:
ISBN:9783319687742
ISSN:2190-5053
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LEADER 00000nam a22000005i 4500
003 SK-BrCVT
005 20220618103557.0
007 cr nn 008mamaa
008 171127s2018 gw | s |||| 0|eng d
020 |a 9783319687742 
024 7 |a 10.1007/978-3-319-68774-2  |2 doi 
035 |a CVTIDW14984 
040 |a Springer-Nature  |b eng  |c CVTISR  |e AACR2 
041 |a eng 
100 1 |a Boukhayma, Assim.  |4 aut 
245 1 0 |a Ultra Low Noise CMOS Image Sensors   |h [electronic resource] /  |c by Assim Boukhayma. 
250 |a 1st ed. 2018. 
260 1 |a Cham :  |b Springer International Publishing,  |c 2018. 
300 |a XIV, 180 p. 110 illus., 69 illus. in color.  |b online resource. 
490 1 |a Springer Theses, Recognizing Outstanding Ph.D. Research,  |x 2190-5053 
500 |a Engineering  
505 0 |a Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion. 
516 |a text file PDF 
520 |a This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors. 
650 0 |a Electronics. 
650 0 |a Microelectronics. 
650 0 |a Signal processing. 
650 0 |a Image processing. 
650 0 |a Speech processing systems. 
650 0 |a Electronic circuits. 
856 4 0 |u http://hanproxy.cvtisr.sk/han/cvti-ebook-springer-eisbn-978-3-319-68774-2  |y Vzdialený prístup pre registrovaných používateľov 
910 |b ZE12264 
919 |a 978-3-319-68774-2 
974 |a andrea.lebedova  |f Elektronické zdroje 
992 |a SUD 
999 |c 246509  |d 246509